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Page 6 - Optical Metrology Equipment

highly precise and easy to use non-contact system for measuring the thickness of optical elements in both, production and quality inspection environments

Specifications

Diameter Range: 8-200mm
Resolution: .5 um
Accuracy: 2 um
Repeatability: 1 um
Data Sheet
5.2\" FIZEAU TRANSMISSION SPHERES FOR USING ON 4“ INTERFEROMETERS - PROVIDING EXTENDED MEASURING RANGE Available Sizes: f / 0.7 f / 0.8 f / 1.1 f / 1.6 f / 2.5 f / 4.2 f / 6.4 f / 9.2 f / 5.9D flat
Data Sheet
VIEW Benchmark XLT
VIEW Micro-Metrology
The VIEW Benchmark™ XLT delivers VIEW performance and reliability in a large travel, non-contact, high precision metrology system. The Benchmark XLT is designed to handle large area parts or nested groups of smaller parts using its moving bridge design. Advanced image processing allows the Benchmark XLT to operate with high speed, ...

Specifications

Measurement Range: 900-1500mm
Measurement Resolution: -- %
Data Sheet
VIEW Benchmark 624
VIEW Micro-Metrology
The VIEW Benchmark™ 624 is a large capacity, fully automatic, 3-axis dimensional measuring system. The Benchmark 624\'s moving bridge design creates an open work envelope for easy access to the measurement area and allows the part being measured to remain stationary at all times. With its massive granite base and high precision ...

Specifications

Measurement Range: 624-624mm
Measurement Resolution: -- %
Data Sheet
VIEW Benchmark 250
VIEW Micro-Metrology
The VIEW Benchmark™ 250 is engineered for high accuracy in a compact benchtop configuration complete with VIEW’s dual magnification optics and metrology-grade construction. The Benchmark 250 is designed for use on the production floor to provide precision measurements for process control. Its compact size and powerful ...

Specifications

Measurement Range: 150-300mm
Measurement Resolution: -- %
Data Sheet
Interferometer VI-vario 10
Vermont Photonics Technologies Corp
Interferometers are an indispensable measurement tool in optical production and quality control. They are used for a wide variety of applications. Examples are testing of flatness and sphericity of optical surfaces, radius measurement and the testing of the wavefront of optical systems. The interferometers of the VI series are ...

Specifications

Interferometer Configuration: Fizeau Interferometer
Light Source: Not Specified
Output Polarization: Not Specified
RMS Repeatability: Not Specified
RMS Precision: Not Specified
Data Sheet
Interferometer VI-direct SL 10
Vermont Photonics Technologies Corp
Interferometers are an indispensable measurement tool in optical production and quality control. They are used for a wide variety of applications. Examples are testing of flatness and sphericity of optical surfaces, radius measurement and the testing of the wavefront of optical systems. The interferometers of the VI series are ...

Specifications

Interferometer Configuration: Fizeau Interferometer
Light Source: Not Specified
Output Polarization:
RMS Repeatability: Not Specified
RMS Precision: Not Specified
Data Sheet
Interferometer VI-direct 10
Vermont Photonics Technologies Corp
Interferometers are an indispensable measurement tool in optical production and quality control. They are used for a wide variety of applications. Examples are testing of flatness and sphericity of optical surfaces, radius measurement and the testing of the wavefront of optical systems. The interferometers of the VI series are ...

Specifications

Interferometer Configuration: Fizeau Interferometer
Light Source: Not Specified
Output Polarization: Not Specified
RMS Repeatability: Not Specified
RMS Precision: Not Specified
Data Sheet
THICKNESS PROFILE MEASUREMENT – COLD TWINSET
Xapt GmbH
The thickness profile measuring system is an extension of our standard thickness measuring system. These systems measure the material thickness at numerous points across the width of the strip. The versatility of gauge design enables customised use of the strip thickness measuring system in very different production lines. These ...

Specifications

Diameter Range: 1-1mm
Resolution: -- um
Accuracy: -- um
Repeatability: -- um
Data Sheet
THICKNESS PROFILE MEASUREMENT - COLD THREE HEAD/EDGE-DROP
Xapt GmbH
The thickness profile measuring system is an extension of our standard thickness measuring system. These systems measure the material thickness at numerous points across the width of the strip. The versatility of gauge design enables customised use of the strip thickness measuring system in very different production lines. These ...

Specifications

Diameter Range: 1-1mm
Resolution: -- um
Accuracy: -- um
Repeatability: -- um
Data Sheet
THICKNESS PROFILE MEASUREMENT – COLD MULTICHANNEL
Xapt GmbH
The thickness profile measuring system is an extension of our standard thickness measuring system. These systems measure the material thickness at numerous points across the width of the strip. The versatility of gauge design enables customised use of the strip thickness measuring system in very different production lines. These ...

Specifications

Diameter Range: 1-1mm
Resolution: -- um
Accuracy: -- um
Repeatability: -- um
Data Sheet
Verifire HDX Interferometry For Precise Mid-Spatial Frequency Characterization
Zemetrics
ZYGO\'s new Verifire HDX interferometer is designed and built for mid-spatial frequency content characterization of extreme performance optical components and systems. The system includes all the great features of the popular Verifire HD – such asQPSI, and a long-life stabilized laser – and adds important enhancements ...

Specifications

Interferometer Configuration: Fizeau Interferometer
Light Source: Not Specified
Output Polarization: Circular, Elliptical, Random
RMS Repeatability: Not Specified
RMS Precision: Not Specified
Data Sheet
Verifire HD Interferometer System
Zemetrics
ZYGO\'s Verifire™ HD interferometer system provides fast high-resolution measurements of flat or spherical surfaces, and transmitted wavefront measurement of optical components and assemblies. The interferometric cavity length is precisely modulated while a high-speed camera captures several fringe images, which are analyzed by ...

Specifications

Interferometer Configuration: Fizeau Interferometer
Light Source: Not Specified
Output Polarization: Circular, Elliptical, Random
RMS Repeatability: Not Specified
RMS Precision: Not Specified
Data Sheet
Verifire Fizeau Interferometer
Zemetrics
ZYGO\'s Verifire™ interferometer system provides fast high-precision measurements of plano or spherical surfaces, and transmitted wavefront ofoptical systems and assemblies. Measure glass or plastic optical components – like flats, lenses, and prisms – and even precision machined metal and ceramic surfaces.A true ...

Specifications

Interferometer Configuration: Fizeau Interferometer
Light Source: Not Specified
Output Polarization: Circular
RMS Repeatability: Not Specified
RMS Precision: Not Specified
Data Sheet
heliCam C3 - Fast Lock-in Camera
Heliotis AG
The lock-in camera was originally developed for low coherence interferometry, but the heliSens™ S3.1 sensor and the camera board have found new life with a variety of applications other than OCT, for example, pump-probe spectroscopy. For ease of integration, the Heliotis\' core technology is now available as a rigid camera, capable ...
Data Sheet
heliOptics WLI6
Heliotis AG
The heliInspetTM H6 has been engineered to meet the specifications of the most demanding 3D in-line inspec-tion tasks such as measuringstep heights, angles, shape, roughness, ripple, waviness, defects, scratches, wear off flatness, coplanarity, deformations film thickness (tomographic mode)Benefitting from Heliotis’ long experience ...

Specifications

Interferometer Configuration: Twyman–Green Interferometer
Light Source: White Light
Output Polarization: Not Specified
RMS Repeatability: <0.01 waves
RMS Precision: <0.005 waves
Data Sheet
heliInspect H8
Heliotis AG
The new heliInspect™ H8 is the latest addition to Heliotis series of unrivaled optical in-line sensors. At its core, this industry grade White-Light-Interferometer utilizes Heliotis next generation 3D-pixel sensor heliSens™ S4.

Specifications

Interferometer Configuration: Twyman–Green Interferometer
Light Source: White Light
Output Polarization: Not Specified
RMS Repeatability: Not Specified
RMS Precision: Not Specified
Data Sheet
Fizeau Interferometers IFV-300 And IFH-300
Armstrong Optical
Newly available from Armstrong Optical are a range of customer-proven phase-measuring Fizeau interferometers with 300mm (12”) aperture in both vertical (downward-looking) and horizontal configurations, IFV-300 and IFH-300. Both configurations are supplied with a certified lambda/20 transmission flat and an ergonomically designed ...

Specifications

Interferometer Configuration: Fizeau Interferometer
Light Source: White Light
Output Polarization: Not Specified
RMS Repeatability: Not Specified
RMS Precision: Not Specified
Data Sheet
Fizeau Interferometer IFV-60
Armstrong Optical
Newly available from Armstrong Optical is a customer-proven phase-measuring Fizeau interferometer with 60mm aperture in a vertical (downward-looking) configuration, IFV-60. The aperture can also be increased to 100 if required. It is supplied with a certified lambda/20 transmission flat and an ergonomically designed sample handling ...

Specifications

Interferometer Configuration: Fizeau Interferometer
Light Source: White Light
Output Polarization: Linear
RMS Repeatability: Not Specified
RMS Precision: Not Specified
Data Sheet
NRT-3000 Ultrafast Polarimeter
New Ridge Technologies
The NRT-3000 is a robust solution for measuring and recording ultrafast polarimeter SOP data. It includes an intuitive GUI to facilitate ease of use.  

Specifications

Wavelength Coverage: 1520-1580nm
Sampling Rate: 38 Samples/Sec
Measured Parameters: Stokes Parameters, Degree of Polarization, Power, SOP Speed
Data Sheet
FDVI Mark IV 3000
Martin Froeschner & Associates
The new M,F& A Mark IV All Fiber Doppler Velocity Interferometer Systems offer enhanced capabilities in the measurement and recording of instantaneous velocity versus time histories. Two versions of the Mark IV Systems are now available. The original Mark IV has been in use all over the world and gives excellent results ...

Specifications

Interferometer Configuration: Not Specified
Light Source: White Light
Output Polarization: Not Specified
RMS Repeatability: <0.01 waves
RMS Precision: <0.01 waves
Data Sheet
The BFC™ facilitates endface geometry measurement of cleaved and polished bare optical fiber. Machined aluminum and steel constructions utilize an easy-to-load clam shell design and V-mount groove to prevent damage to fibers during loading. An optional Loading Station* can also be used to assist with sample preparation and alignment. ...
Data Sheet
The BFC™ facilitates endface geometry measurement of cleaved and polished bare optical fiber. Machined aluminum and steel constructions utilize an easy-to-load clam shell design and V-mount groove to prevent damage to fibers during loading. An optional Loading Station* can also be used to assist with sample preparation and alignment. ...
Data Sheet
The BFC™ facilitates endface geometry measurement of cleaved and polished bare optical fiber. Machined aluminum and steel constructions utilize an easy-to-load clam shell design and V-mount groove to prevent damage to fibers during loading. An optional Loading Station* can also be used to assist with sample preparation and alignment. ...
Data Sheet
The BFC™ facilitates endface geometry measurement of cleaved and polished bare optical fiber. Machined aluminum and steel constructions utilize an easy-to-load clam shell design and V-mount groove to prevent damage to fibers during loading. An optional Loading Station* can also be used to assist with sample preparation and alignment. ...
Data Sheet