Page 5 - Optical Metrology | Non-Contact Inspection Solutions

Spectrum Metrology Ltd

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The new Intra Touch from Taylor Hobson - the latest in their range of shopfloor measurement solutions for surface finish, form and optional contour analysis - incorporates the user-friendly Talyprofile software on a touchscreen tablet PC.

Specifications
Light Source Type:	CW LED
Light Source Wavelength:	-- nm
Sample Reflectivity:	1-1%
Vertical Range:	-- nm
RMS Repeatability:	<0.01 nm
...

Data Sheet

Surtronic-R Precision High Speed Roundness Measurement

Spectrum Metrology Ltd

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The new Surtronic-R Series is a high speed roundness measurement station which is robust enough for shopfloor but accurate enough for any inspection room.The Surtronic R-80 is ideal for a range of roundness measurement applications including aerospace and automotive engineering: Valves ... Con Rods ... Pins ... Brake Discs .. ...

Specifications
Light Source Type:	CW LED
Light Source Wavelength:	30 nm
Sample Reflectivity:	1-1%
Vertical Range:	6 nm
RMS Repeatability:	<0.01 nm
...

Data Sheet

Form Talysurf Intra Contour

Spectrum Metrology Ltd

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This latest portable shop floor contour system in the Form Talysurf range offers a wide range of 32mm to accommodate even the largest features on typical components with enough resolution to detect the smallest contour deviations (120nm) (super precision mode delivers 25nm over a 6.4mm range). A 20mm range pickup option offers ...

Specifications
Light Source Type:	CW LED
Light Source Wavelength:	120 nm
Sample Reflectivity:	1-1%
Vertical Range:	-- nm
RMS Repeatability:	<0.01 nm
...

Data Sheet

Precision Spectrometers GMR-1D

Shimadzu Corp

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Angle and Refractive Index Measurement System from UV Range to Near-IR Range.

Specifications
Index Measurement Range:	1.20-2.05
Accuracy:	-0.0001-0.0001
Repeatability:	-0.000001-0.000001

Data Sheet

Kalnew Precision Refractometer KPR-300

Shimadzu Corp

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$Kalnew Precision Refractometer KPR-300$

With the V-block method, samples finished to a 90 degree angle are measured. The instrument is capable of high-accuracy measurements (in comparison to the Abbe method (critical angle method)), with a measurement accuracy of ±4 × 10-5, and a display resolution of 0.1 × 10-5. The finished surface of the sample does not require the ...

Specifications
Index Measurement Range:	1.20-2.05
Accuracy:	-0.00004-0.00004
Repeatability:	-0.00001-0.00001

Data Sheet

Antaris 350 LONG STANDOFF LASER TRIANGULATION SENSOR FOR HOT APPLICATIONS

Scantron Industrial Products Ltd

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The ANTARIS Series of triangulation sensors is built for long-standoff measurement, such as where the measurement target is extremely hot – for example, hot profile or flatness measurement on hot steel strip. The intelligent signal processing controls exposure of the CCD array and laser power in real time, resulting in excellent ...

Specifications
Measurement Range:	350-620mm
Measurement Resolution:	-- %

Data Sheet

Polaris 10 PRECISION LASER TRIANGULATION GAUGE FOR THE STEEL-METALS INDUSTRY

Scantron Industrial Products Ltd

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cantron is an established supplier of the POLARIS series, high-precision, robust and flexible laser sensors which were designed specifically for use within the demandingsteels and metal industry. The POLARIS Series of triangulation sensors are highest-precision laser sensors available for measurement of displacement, distance or ...

Specifications
Measurement Range:	10-51mm
Measurement Resolution:	-- %

Data Sheet

ATLAS 10 DIGITAL LASER SENSOR

Scantron Industrial Products Ltd

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The ATLAS Series of miniaturised laser triangulation sensors are compact, accurate sensors for measurement of displacement, distance or height, or thickness when combined in pairs. The intelligent signal processing controls exposure of the CCD array and laser power in real time, resulting in excellent dynamic behaviour ...

Specifications
Measurement Range:	2-40mm
Measurement Resolution:	2 %

Data Sheet

QED Inteferometer for Stitching QIS

QED Technologies Inc

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The QIS interferometer completely designed, engineered and built by QED Technologies. It is optimized for stitching and gives customers the ability to measure more parts, with improved accuracy, speed and ease of use. QED’s QIS incorporates hardware and software features designed to enhance the performance of QED’s metrology ...

Specifications
Interferometer Configuration:	Not Specified
Light Source:	Not Specified
Output Polarization:	Not Specified
RMS Repeatability:	Not Specified
RMS Precision:	Not Specified

Data Sheet

TrueSurf

TrueGage

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Most surface texture gages produced today work quite well, however, many lack the graphics or all of the computing power that you truly need. TrueSurf can make any gage capable of computing all of the latest ASME and ISO parameters. Enhance the capabilities of your low end instruments with TrueSurf software to visualize the profile ...

Data Sheet

TrueMap v5

TrueGage

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A wide variety of instruments are now available for 3D surface measurements. A partial list of these instruments includes stylus profilometers, optical profilometers, scanning probe microscopes (SPMs), laser confocal microscopes, and laser scanning sensors. The best instrument to use quite often depends on the type of surface that is ...

Data Sheet

TrueMap v6 Beta

TrueGage

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A wide variety of instruments are now available for 3D surface measurements. A partial list of these instruments includes stylus profilometers, optical profilometers, scanning probe microscopes (SPMs), laser confocal microscopes, and laser scanning sensors. The best instrument to use quite often depends on the type of surface that is ...

Data Sheet

CDX-L15A Ultra High Accuracy Laser Displacement Sensor

Ramco Innovations Inc

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With conventional image sensors, feedback control to the shutter could not keep up with sudden changes in receiving light levels caused by changes in workpiece colors, momentary inabilities to perform measurements would be caused, resulting in response delays. With newly developed ATMOS image sensors, measurements can be performed ...

Specifications
Measurement Range:	110-190mm
Measurement Resolution:	0.25 %

Data Sheet

TeraTone Low-Noise Frequency Comb

RAM Photonics LLC

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TeraToneTM is the first optical frequency comb providing more than 100 low-noise carriers over continuous C+L band. Carriers can be generated over any ITU channel grid, with kHz-level linewidth and 100-fold better frequency stability than standard telecommunication sources.

Specifications
Comb Spacing:	30 MHz
Center Wavelength:	1530 nm
Oscillator Spectral Range:	Not Specified
Comb Wavelength Range And Options:	Not Specified

Data Sheet

Solid Etalons

TecOptics Corp

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Solid Etalons typically have fused silica substrates with the material grade (e.g. UV-visible or IR) dependent on the spectral region. The faces are ground, polished, and figured typically to better than l/100 flatness with similar quality parallelism between the faces. Dielectric (or, rarely, metallic) coatings provide the ...

Specifications
Interferometer Configuration:	Not Specified
Light Source:
Output Polarization:	Not Specified
RMS Repeatability:	Not Specified
RMS Precision:	<0.01 waves

Data Sheet

Air-Spaced Etalons

TecOptics Corp

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Air-Spaced Etalons have appropriate grade fused silica (UV-visible or IR) substrates. Outside-face AR coatings and wedges on the substrates prevent extraneous interference patterns from forming. Spacers, optically contacted to the substrates, determine the parallelism of the mirrored surfaces and the etalon’s free spectral ...

Specifications
Interferometer Configuration:	Not Specified
Light Source:	Not Specified
Output Polarization:	Not Specified
RMS Repeatability:	Not Specified
RMS Precision:	<0.01 waves

Data Sheet

MicroEtalons

TecOptics Corp

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Fiber optic communication requires extreme miniaturization of optical components. It is for applications such as DWDM (dense wavelength division multiplexing), line narrowing, and channel monitoring that TecOptics introduced its new line of MicroEtalons. Newly developed manufacturing techniques enable TecOptics to supply large ...

Specifications
Interferometer Configuration:	Not Specified
Light Source:	632 nm or 633nm, 355nm, 532nm, 780nm, 1053nm, 1064nm, 1550nm, 10.6um, 543nm, 594nm
Output Polarization:	Not Specified
RMS Repeatability:	Not Specified
RMS Precision:	<0.01 waves

Data Sheet

Form Talysurf PGI Optics

Taylor Hobson Precision

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Taylor Hobson Form Talysurf PGI (Phase Grating Interferometer) - contact stylus profilometer/Equipment measures large sag lens (surfaces form) plastic lenses, small components, IR glass and crystals up to 300mm diameter with high accuracy and it is a number one instrument for optics manufacturers. Following its first release in 1984, ...

Specifications
Light Source Type:	Coherent Continuous Wave (CW)
Light Source Wavelength:	2 nm
Sample Reflectivity:	1-1%
Vertical Range:	-- nm
RMS Repeatability:	<0.001 nm
...

Data Sheet

Form Talysurf PGI Matrix

Taylor Hobson Precision

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aylor Hobson Stylus Optics Profilometer: Form Talysurf PGI Matrix is an easy to set-up, test and analysis for single or multiple parts. This instrument is perfect optical surface form measurement system for fast and accurate testing of optical components up to 200 mm Diameter. A modular system, adaptable for differing budgets and ...

Specifications
Light Source Type:	Coherent Continuous Wave (CW)
Light Source Wavelength:	-- nm
Sample Reflectivity:	1-1%
Vertical Range:	-- nm
RMS Repeatability:	<0.001 nm
...

Data Sheet

Form Talysurf PGI Freeform

Taylor Hobson Precision

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aylor Hobson\'s Form Talysurf PGI (Phase Grating Interferometer) is a versatile, high resolution 3D Freeform profilometer for high precision freeform optics measurement. It performs surface finish and form analysis for freefrom optics. Taylor Hobson’s Form Talysurf® PG Freeform is underpinned by ...

Specifications
Light Source Type:	Coherent Continuous Wave (CW)
Light Source Wavelength:	800 nm
Sample Reflectivity:	1-1%
Vertical Range:	-- nm
RMS Repeatability:	<0.001 nm
...

Data Sheet

X-fiz Fizeau Interferometer

XONOX Technology GmbH

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Phase Shifting Fizeau Interferometer in 4\", 5.2\" and 6\" versions

Specifications
Interferometer Configuration:	Fizeau Interferometer
Light Source:	632 nm or 633nm
Output Polarization:	Linear
RMS Repeatability:	Not Specified
RMS Precision:	Not Specified

Data Sheet

DT140 Diameter Measurement System

XONOX Technology GmbH

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highly precise and easy to use system for measuring the diameters of optical elements in both, production and quality inspection environments designed for long term reliability and cost effective operation

Specifications
Diameter Measurement:	8mm to 140mm

Data Sheet

CM 140 Centering Error Measurement System

XONOX Technology GmbH

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precise and easy to operate measurement system for determining centering errors on lens elements in production, quality inspection or metrology lab environments

Data Sheet

VT1000 DL Interferometer Workstation

XONOX Technology GmbH

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The XONOX VT1000 DL is a precision interferometer workstations in a feature-rich downward looking tower configurations. The integrated Fizeau interferometer offers precise surface metrology while the natural granite column with integrated air-bearing facilitates precise radius measurement capability. The downward looking ...

Specifications
Interferometer Configuration:	Fizeau Interferometer
Light Source:	632 nm or 633nm
Output Polarization:	Linear
RMS Repeatability:	Not Specified
RMS Precision:	Not Specified

Data Sheet

VT750 & VT1200 Interferometer Workstations

XONOX Technology GmbH

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The XONOX VT1200 and VT750 represent precision interferometer workstations in convenient upward looking tower configurations. The integrated Fizeau interferometer offers precise surface metrology while the natural granite column with integrated air-bearing facilitates precise radius measurement capability. The workstation ...

Specifications
Interferometer Configuration:	Fizeau Interferometer
Light Source:	632 nm or 633nm
Output Polarization:	Linear
RMS Repeatability:	Not Specified
RMS Precision:	Not Specified

Data Sheet

Optical Metrology

Page 5 - Optical Metrology Equipment

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