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Description

Kaleo MultiWAVE Multi-Wavelength Interferometer for Optical Metrology

The Kaleo MultiWAVE from PHASICS is a high-performance multi-wavelength interferometer designed for precision wavefront metrology of coated and uncoated optics. Developed for demanding optical testing environments, it enables accurate measurement of both transmitted wavefront error (TWE) and reflected wavefront error (RWE), making it especially well suited for qualifying filters, mirrors, lenses, windows, and coated optical components at their actual operating wavelengths.

Unlike conventional single-wavelength interferometers, Kaleo MultiWAVE supports measurements across multiple spectral ranges, allowing users to test optics under conditions that closely match real-world use. The system can be configured with standard one- or two-wavelength operation, with custom configurations available for up to eight wavelengths. Its wavelength coverage can extend from deep ultraviolet through visible, near-infrared, short-wave infrared, mid-wave infrared, and long-wave infrared ranges, including common metrology wavelengths such as 266 nm, 355 nm, 405 nm, 550 nm, 625 nm, 780 nm, 940 nm, 1050 nm, 1.55 µm, 2.0 µm, 3.39 µm, and 10.6 µm.

This interferometric system is engineered for optics and filter manufacturers that require reliable qualification of components at dedicated wavelengths. It is particularly valuable for testing bandpass filters, narrowband filters, coated optics, plane mirrors, reflective surfaces, and transparent optical elements. With a clear aperture of up to 5.1 inches / 130 mm, Kaleo MultiWAVE accommodates large optical components while maintaining measurement performance comparable to Fizeau interferometry.

A major advantage of the Kaleo MultiWAVE is its ability to measure large aberrations with a wide dynamic range. The instrument can evaluate high-departure wavefronts and optical surfaces that may be difficult to characterize with classical Fizeau interferometers. This makes it a strong solution for high-dynamics surface testing, optical coating validation, and advanced metrology workflows where large defocus or significant wavefront deformation must be measured accurately.

The system operates in a double-pass configuration and provides precise RWE measurement of reflective surfaces as well as TWE measurement of transparent optics. Its achromatic design allows consistent performance across different wavelengths, helping laboratories and production teams qualify components at the same wavelength used in the final optical system. This is especially important for applications in space and defense, automotive optics, laser systems, optical filter production, infrared imaging, and precision photonics manufacturing.

Kaleo MultiWAVE is designed for practical use in production and laboratory environments. It is insensitive to vibration and does not require dedicated vibration isolation, simplifying installation compared with many traditional interferometric test setups. Live phase visualization and Zernike coefficient display support efficient alignment, while compatibility with depolarizing optics expands its usefulness for coated and complex optical assemblies.

With sub-nanometer RMS repeatability under specified conditions, broad sample reflectivity compatibility, and a large measurable defocus range, Kaleo MultiWAVE provides a cost-effective alternative to purchasing multiple wavelength-specific interferometers. For organizations seeking a flexible optical interferometer for wavefront error measurement, coating inspection, filter testing, and large-aperture optics qualification, Kaleo MultiWAVE delivers a versatile metrology platform built for accurate testing at real operating wavelengths.

Phasics Kaleo MultiWAVE Multi Wavelength Wavefront Interferometer for Optics Testing

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Specifications

Interferometer Configuration: Not Specified
Light Source: 543nm, 594nm, 632 nm or 633nm, 1550nm, 1064nm, 1053nm, 780nm, 532nm, 355nm
Output Polarization: Not Specified
RMS Repeatability: Not Specified
RMS Precision: Not Specified
Type: Multi-wavelength large dynamic range interferometer
Measurement Types: Transmitted wavefront error (TWE) and reflected wavefront error (RWE)
Configuration: Double pass
Measurement Capability: RWE of reflective surfaces; TWE of transparent optics
Number Of Wavelengths Per Instrument: 1 or 2 standard, up to 8 custom
Custom Wavelength Range: 193 nm to 14 µm
UV Wavelengths: 266 nm, 355 nm, 405 nm
VIS/NIR Wavelengths: 550 nm, 625 nm, 780 nm, 940 nm, 1050 nm
SWIR/MWIR/LWIR Wavelengths: 1.55 µm, 2.0 µm, 3.39 µm, 10.6 µm
Clear Aperture: 5.1 in (130 mm)
Beam Height: 108 mm
Alignment System: Live phase and Zernike coefficients display
Polarization Compatibility: Compatible with depolarizing optics
Alignment FOV: +/- 2°
Pupil Focus Range: +/- 2.5 m
Dimensions: 910 x 600 x 260 mm
Weight: 25 kg
Vibration Isolation: Not necessary
RMS Repeatability: <0.7 nm (<λ/900)
Accuracy: 80 nm PV
Dynamic Range Defocus: 500 fringes (SFE = 150 µm)
Aberration Measurement Range: >20λ
Sample Reflectivity Range: ~4% to 100%
Performance Reference Conditions: 4 in pupil size with 625 nm source
Software Compatibility: MetroPro and ISO compatible
Measurements: WFE and MTF

Got questions about specs? Use the inquiry form to ask.

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Features

Key Features of the PHASICS Kaleo MultiWAVE Multi-Wavelength Interferometer

  • Multi-wavelength interferometer for optical metrology: Kaleo MultiWAVE enables wavefront error testing at the actual operating wavelength of the optic, making it ideal for qualification of coated optics, optical filters, mirrors, lenses, and transparent components.
  • Measures both transmitted and reflected wavefront error: Supports TWE testing of transparent optics and RWE testing of reflective surfaces in a double-pass configuration.
  • Up to 8 wavelengths in one instrument: Available with 1 or 2 standard wavelengths and configurable with up to 8 custom wavelengths, reducing the need to purchase multiple single-wavelength interferometers.
  • Broad wavelength compatibility from UV to LWIR: Supports custom wavelengths from 193 nm to 14 µm, including common options such as 266 nm, 355 nm, 405 nm, 550 nm, 625 nm, 780 nm, 940 nm, 1050 nm, 1.55 µm, 2.0 µm, 3.39 µm, and 10.6 µm.
  • High dynamic range measurement capability: Measures more than 20λ of aberration and provides greater dynamic range than classical Fizeau interferometers for challenging optics and highly aberrated samples.
  • Large aberration and high-defocus testing: Offers a defocus dynamic range of up to 500 fringes, corresponding to approximately 150 µm surface figure error, enabling characterization of optics with significant wavefront deviation.
  • Large clear aperture: Qualifies coated and uncoated optics over a clear aperture of up to 5.1 inches / 130 mm, suitable for demanding precision optics, filter, and mirror testing applications.
  • Measurement accuracy comparable to Fizeau interferometry: Delivers reliable interferometric performance with <0.7 nm RMS repeatability and 80 nm PV accuracy under specified test conditions.
  • Vibration-insensitive operation: Designed to operate without dedicated vibration isolation, simplifying installation and enabling use in production environments, optical workshops, and metrology labs.
  • Ideal for coated optics and optical filter testing: Enables qualification of narrow bandpass filters, wide bandpass filters, coated substrates, mirrors, and optical assemblies at their real working wavelength.
  • Achromatic measurement system: Provides consistent wavefront measurement results across different wavelengths, allowing users to match the interferometer wavelength to the application wavelength.
  • Wide sample reflectivity range: Compatible with samples ranging from approximately 4% to 100% reflectivity, supporting both low-reflectivity coated optics and highly reflective components.
  • Compatible with depolarizing optics: Supports measurement of optical components that may depolarize light, expanding usability across complex coatings and specialty optical materials.
  • Live alignment assistance: Includes live phase display and Zernike coefficient visualization for fast, accurate sample alignment and efficient measurement setup.
  • Wavefront error and MTF measurement: Supports WFE and MTF analysis, helping users evaluate optical quality, imaging performance, and system-level optical behavior.
  • MetroPro and ISO compatibility: Designed for integration into established optical metrology workflows with compatibility for common interferometry data formats and ISO-based analysis practices.
  • Cost-effective alternative to multiple interferometers: By combining multiple wavelength capabilities into a single platform, Kaleo MultiWAVE provides a practical solution for labs and manufacturers testing optics across UV, visible, NIR, SWIR, MWIR, and LWIR ranges.
  • Optimized for precision optics manufacturing: Well suited for optics and filter manufacturers requiring repeatable production testing of coated optics, mirrors, windows, lenses, filters, and optical assemblies.
  • Supports demanding markets: Designed for applications in space and defense, automotive optics, laser optics, IR optics, and precision optical component manufacturing.
  • Compact metrology platform: System dimensions of approximately 910 x 600 x 260 mm and a weight of about 25 kg make it suitable for laboratory benches and industrial metrology stations.

Applications

Applications of the Kaleo MultiWAVE Multi-Wavelength High Dynamic Range Interferometer

  • Coated optics testing at operating wavelengths: Qualification of optical coatings at their real-use wavelengths, including UV, visible, NIR, SWIR, MWIR, and LWIR bands.
  • Optical filter testing: Measurement of transmitted wavefront error and reflected wavefront error for narrow bandpass filters, wide bandpass filters, dichroic filters, laser line filters, edge filters, and high-performance coated filters.
  • Transmitted wavefront error measurement: Accurate TWE measurement of transparent optics such as windows, lenses, plates, substrates, filters, and transmissive assemblies.
  • Reflected wavefront error measurement: RWE measurement of reflective surfaces, mirrors, coated mirrors, high-reflectivity optics, and partially reflective optical components.
  • High dynamic range surface testing: Characterization of optics with large aberrations, strong defocus, and high fringe density beyond the typical dynamic range of classical Fizeau interferometers.
  • Large aperture optics inspection: Interferometric testing of optics up to 5.1 inches / 130 mm clear aperture, including optical flats, mirrors, windows, filters, and coated components.
  • Multi-wavelength optical metrology: Wavefront testing at up to 8 custom wavelengths in a single instrument, reducing the need for multiple wavelength-specific interferometers.
  • UV optics qualification: Testing of ultraviolet optics and coatings at wavelengths such as 193 nm, 266 nm, 355 nm, and 405 nm for lithography, excimer laser, semiconductor, and scientific applications.
  • Visible and near-infrared optics testing: Measurement of optical components at common VIS/NIR wavelengths including 550 nm, 625 nm, 780 nm, 940 nm, and 1050 nm.
  • Infrared optics and coating inspection: Interferometric qualification of SWIR, MWIR, and LWIR optics at wavelengths such as 1.55 µm, 2.0 µm, 3.39 µm, and 10.6 µm.
  • Laser optics testing: Wavefront quality control of laser mirrors, laser windows, beam delivery optics, laser filters, and coated components at their exact working laser wavelength.
  • Space optics metrology: Qualification of optical filters, windows, mirrors, and coated elements used in satellites, telescopes, Earth observation payloads, and spaceborne imaging systems.
  • Defense and aerospace optical testing: Inspection of high-performance optics used in targeting systems, surveillance, infrared imaging, laser systems, night vision, and directed-energy applications.
  • Automotive optics quality control: Testing of optical filters, sensors, LiDAR optics, camera windows, infrared components, and coated optics for automotive imaging and sensing platforms.
  • LiDAR optics characterization: Measurement of wavefront error in LiDAR windows, beam-shaping optics, filters, and coatings at wavelengths such as 905 nm, 940 nm, 1050 nm, and 1550 nm.
  • Optics manufacturing quality assurance: Production and final inspection of precision optics, coated optics, optical flats, filter assemblies, and transmissive or reflective components.
  • Filter manufacturer process control: Verification of coating uniformity, wavefront distortion, stress-induced deformation, and optical performance of complex multilayer coated filters.
  • Mirror and reflective surface testing: Measurement of plane mirrors, coated mirrors, metallic mirrors, dielectric mirrors, and other reflective optical components with high repeatability.
  • High-reflectivity and low-reflectivity sample testing: Characterization of samples across a broad reflectivity range, from approximately 4% to 100%, including coated and uncoated optics.
  • Depolarizing optics measurement: Wavefront testing of optics that depolarize light, where standard interferometric configurations may be limited.
  • Optical assembly alignment and verification: Live phase and Zernike coefficient display for alignment, adjustment, and verification of optical components and assemblies.
  • MTF and wavefront performance evaluation: Measurement of wavefront error and modulation transfer function for assessing imaging quality in optical systems and components.
  • Replacement for multiple interferometers: Cost-effective multi-wavelength interferometric testing solution for laboratories and manufacturers that need to qualify optics at several operating wavelengths.
  • Vibration-insensitive interferometry: Optical m

Frequently Asked Questions

What is the PHASICS Kaleo MultiWAVE interferometer used for?
The PHASICS Kaleo MultiWAVE is a multi-wavelength optical interferometer used to measure transmitted wavefront error (TWE) and reflected wavefront error (RWE) of coated optics, uncoated optics, filters, mirrors, and high-dynamic-range optical surfaces. It is designed for testing optics at their real operating wavelengths, making it suitable for optics and filter manufacturers, space and defense, automotive, and advanced optical metrology applications.
How many wavelengths can the Kaleo MultiWAVE support?
The Kaleo MultiWAVE is available with 1 or 2 wavelengths as standard and can be customized to support up to 8 wavelengths. Custom wavelength options cover a very broad range from 193 nm to 14 µm, including UV, visible, NIR, SWIR, MWIR, and LWIR wavelengths such as 266 nm, 355 nm, 405 nm, 625 nm, 780 nm, 1050 nm, 1.55 µm, 3.39 µm, and 10.6 µm.
What is the clear aperture of the Kaleo MultiWAVE interferometer?
The Kaleo MultiWAVE offers a clear aperture of 5.1 inches, or 130 mm, allowing it to qualify optics and filters up to approximately 5 inches in diameter. This makes it well suited for production and laboratory testing of larger optical components, wide bandpass filters, narrow bandpass filters, plane mirrors, and coated optics.
How does the Kaleo MultiWAVE compare with a Fizeau interferometer?
The Kaleo MultiWAVE provides measurement accuracy comparable to Fizeau interferometry while offering a much larger dynamic range and multi-wavelength flexibility. Unlike many classical Fizeau interferometers, it can measure more than 20λ of aberration and up to 500 fringes of defocus, making it advantageous for testing highly aberrated optics, coated components, and filters at their actual working wavelengths.
Can the Kaleo MultiWAVE measure both reflective and transmissive optics?
Yes. In a double-pass configuration, the Kaleo MultiWAVE can measure reflected wavefront error (RWE) of reflective surfaces and transmitted wavefront error (TWE) of transparent optics. This dual capability makes it a cost-effective alternative to purchasing separate interferometers for mirror, lens, window, and optical filter testing.
What are the measurement performance specifications of the Kaleo MultiWAVE?
According to the datasheet, the Kaleo MultiWAVE provides RMS repeatability of less than 0.7 nm, or better than λ/900, on a 4-inch pupil with a 625 nm source. It has an accuracy specification of 80 nm peak-to-valley for a 1 µm PV defocus, supports a sample reflectivity range of approximately 4% to 100%, and offers a high defocus dynamic range of 500 fringes, equivalent to SFE = 150 µm.
Does the Kaleo MultiWAVE require vibration isolation?
No. The Kaleo MultiWAVE is designed to be insensitive to vibration and does not require a dedicated vibration isolation table. This simplifies installation compared with many conventional interferometer systems and makes it easier to integrate into production environments, optical workshops, and metrology labs.

Got more questions? Use the inquiry form to ask the supplier directly.

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