Description
Phasics is innovating in optical metrology with a new instrument able to measure both transmitted and reflected wavefront error (TWE/RWE). Coated and uncoated optics can be qualified over a diameters from 30 to 150 mm at their working wavelengths. The Kaleo MultiWAVE is an advantageous alternative and cost-effective solution to the purchase of several interferometers. The system offers a measurement accuracy comparable to Fizeau interferometry.
Kaleo MultiWave Interferometer
Specifications
| Interferometer Configuration: | Not Specified |
|---|---|
| Light Source: | 543nm, 594nm, 632 nm or 633nm, 1550nm, 1064nm, 1053nm, 780nm, 532nm, 355nm |
| Output Polarization: | Not Specified |
| RMS Repeatability: | Not Specified |
| RMS Precision: | Not Specified |
Download Data Sheet
Features
- Any wavelength on demand: UV - VISIBLE - NIR - SWIR - MWIR - LWIR
- Multiple wavelengths on the same test instrument
- Nanometric phase resolution and large dynamics (> 500 fringes)
Applications
Optics metrology and optical system alignment
Markets:
- Optical components and assemblies
- Coated optics
- AR/VR
- Smartphone
- Aerospace
- Defense
- Automotive
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