MESO Metrology System

Specifications

Interferometer Configuration: Not Specified
Light Source: 543nm, 594nm, 632 nm or 633nm, 780nm, 532nm
Output Polarization: Linear, Circular
RMS Repeatability: <0.01 waves
RMS Precision: <0.01 waves
Optical Axis: text 108 mm
Dimensions: text 63 x 30 x 45 cm
Phase Point Resolution: text 680 x 500
Test Beam Diameter: text Optical zoom from 1.5″ (38.1mm) up to 6″ (152 mm)
Calibrated Range: text 405 nm to 830 nm
Wavelength: text Custom 405, 488, 520, 635, 785, 830 nm
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Features


  • Insensitive to vibrations​

  • At-design wavelength testing​

  • Insensitive to reflections from sample back surface​​

Applications

MESO is the perfect testing tool for the control of:



  • Parallel Optics

  • Screens

  • Filters, dichroics

  • Mirrors

  • Beamsplitters

  • Windows

  • Substrates

  • Corner cubes

  • Crystals

  • Rods, Disks

  • Glass wafers

  • Displays

  • Machined surfaces

  • Windshields

  • Prisms

  • Large lenses

  • Optical systems

  • Beam expanders