410-Solar Reflectometer

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Specifications

Wavelength Bands: 335-380, 400-540 nm, 480-600 nm, 590-720 nm, 700-1100 nm, 1000-1700 nm, 1700-2500
Angle Of Incidence (from Normal): 20 deg
Accuracy: 0.02 (abs. refl. units)
Repeatability: 0.005 units
Beam Spot Size: 6.35 mm
Measurement Time: 10 sec
Repeatability:: ±.005 units
Run Time:: 2 hours on one battery
Operating Temp:: 0° to 40°C
Sample Temperature:: Ambient or heated/cooled to 0 – 100°C
Time Between Measurements:: 2 seconds
Warm Up Time:: 90 seconds
Sample Size & Geometry:: Flat: ≥ 0.5 in. diameter Curved: 6 in. convex; 12 in. concave
Measurement Time:: 7 to 10 seconds
Beam Spot Size:: 0.25 inches to 0.50 inches
Measured Parameter: Directional hemispherical reflectance (DHR)
Accuracy:: +/- .02
Calibration Coupon:: Specular, Diffuse & Glazed Ceramic
ASTM Standards: C1549 E1980 E903
Angle Of Incidence:: 20° from normal incidence
Wavelength Bands: 335-380, 400-540, 480-600, 590-720, 700-1100, 1000-1700, 1700-2500
Calculated Value: Total solar reflectance, solar absorptance, specular reflectance
Measured Value: Absolute reflectance (0-1), Diffuse reflectance

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Features

  • ASTM Compliant: Conforms to ASTM E408, E1980, C1549 standards for emittance determination using a portable instrument.
  • 7 Discrete Bands: Provides in-band reflectance data for seven discrete bands: 335-380, 400-540, 480-600, 590-720, 700-1100, 1000-1700, 1700-2500.
  • Multiple Solar Irradiance Functions: New or custom functions can be added to the default options including AM 0, 1.5.
  • Analysis Of Total Reflectance: Identify specular and diffuse components of total reflectance.
  • Fast Calibration: One minute calibration at start of measurement session.
  • Immediate Data: Touch screen display for data review and management.

Applications

  • Space Coatings Thermal Control: Optimize materials for spacecraft thermal management.
  • Concentrated Solar: Mirror evaluation and selective absorber coatings
  • Defense & Aerospace: Essential for IR signature reduction and heat transfer studies.
  • Semiconductor Industry: Analyze wafer emissivity and fabrication processes.
  • Cool Building Analysis: Evaluate reflective materials for energy-efficient construction.
  • Radiative Heat Transfer: Absorptance for thermal modeling