iKon-M SO High Energy Detection
Description
iKon-M SO High Energy Detection
Specifications |
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|---|---|
| Sensor Type: | CCD |
| Detection Method: | Direct Detection |
| # Pixels (Width): | 1024 |
| # Pixels (Height): | 1024 |
| Pixel Size (Square): | 13 um |
| Bit Depth: | 16 bit |
| Full Frame Rate: | 4.4 fps |
| X-Ray Energy Range: | 1-10000eV |
| Cooling: | -100 °C |
| Peak QE: | 95 % |
| Read Noise: | 2.9 e- |
| Pixel Well Depth: | 100000 e- |
Features
- Open front end - DN100CF / 6” CF / CF-152 flange and knife-edge sealing provided as standard for direct interfacing to vacuum chambers (rotatable design for iKon-M models).
- 1 MP and 4.2 MP sensor options - Choice of acquisition speed or large field-of-view to best match experimental needs.
- 13 x 13 µm pixel size - Ideal balance of dynamic range and resolution, on-head binning to extend dynamic range.
- Peak QE of 95% - High photon collection efficiency for maximising signal-to-noise ratios. ‘Enhanced’ process back-illuminated sensor options for increased QE in the soft x-ray range.
- Thermo-electric cooling down to -100°C - Efficiently minimizes dark current noise for acquisitions requiring longer sensor exposure time, obtain better signal-to-noise ratios faster.
- Low noise readout down to 2.9 e- - Intelligent low-noise electronics offer the most ‘silent’ system noise.
- Up to 5 MHz pixel readout speed - Slow readout for low noise and best SNR performance, faster speed for studying dynamic processes and 5 MHz focusing mode.
- USB 2.0 interface - Built-in robust plug and play interface as standard.
- Cropped sensor mode - Tracking stability to ensure all readout circuits experience same temperature and operating conditions.
- Enhanced Baseline Clamp - Slower readout for lowest noise, faster speeds for more rapid readout and focusing.
Applications
- VUV/EUV/XUV Imaging
- X-Ray Imaging
- X-Ray Microscopy
- X-Ray Diffraction (XRD)
- X-Ray Plasma Imaging
- X-Ray source characterization
- X-Ray Phase Contrast Imaging
- X-Ray Tomography
- High Harmonic Generation (HHG) P Crystallography
For pricing, technical or any other questions please contact the supplier
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How to order?
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Ships from:
Canada
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Frequently Asked Questions
The iKon-M SO High Energy Detection offers 1 MP and 4.2 MP sensor options with 13 x 13 µm pixel size.
The iKon-M SO High Energy Detection is used for VUV/EUV/XUV Imaging, X-Ray Imaging, X-Ray Microscopy, X-Ray Diffraction (XRD), X-Ray Plasma Imaging, X-Ray source characterization, X-Ray Phase Contrast Imaging, X-Ray Tomography, High Harmonic Generation (HHG), and Crystallography.
The iKon-M SO High Energy Detection has a peak QE of 95% in the soft x-ray range.
The iKon-M SO High Energy Detection has a readout noise as low as 2.9 e-.
The iKon-M SO High Energy Detection has thermo-electric cooling down to -100°C to efficiently minimize dark current noise for acquisitions requiring longer sensor exposure time and obtain better signal-to-noise ratios faster.