EQ-400 LDLS®

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Specifications

Spectral Output: 170 – 2500 nm
Numerical Aperture: 0.5
Typical Bulb Life: >9000 hrs
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Features

  • Ultra-High Radiance Output: Delivers exceptional brightness for fast, high-throughput measurements across demanding applications.
  • Low Noise & Excellent Spatial Stability: Ensures precise, repeatable, and reliable measurement results.
  • Flexible Output Configuration: Available with dual-beam output or higher-output single-beam configuration using an integrated retro-reflector.
  • Compact, Water-Cooled Lamphouse: Provides stable operation, long lifetime, and efficient thermal management in a clean, compact design.
  • Broadband Spectral Coverage: High brightness across the UV–Vis–NIR spectrum, supporting a wide range of optical techniques.
  • Electrodeless LDLS® Technology: Eliminates electrodes to extend operational lifetime and reduce cost of ownership.

Applications

  • Semiconductor Metrology & Inspection: Broadband illumination for precision wafer, mask, and defect analysis.
  • UV–Vis–NIR Spectroscopy: High-brightness source for analytical, research, and materials spectroscopy.
  • Photoemission Electron Microscopy (PEEM): Stable, high-radiance illumination for advanced surface and materials imaging.
  • Thin-Film Measurement: Accurate characterization of thin films across ultraviolet through near-infrared wavelengths.
  • Materials Characterization: Detailed optical analysis of material properties with high stability and repeatability.
  • Advanced Imaging Systems: Suitable for imaging applications requiring powerful, stable broadband illumination.