EQ-77 Broadband Laser-Driven Source

Specifications

Spectral Output: 170 – 2100 nm
Numerical Aperture: 50
Typical Bulb Life: >9000 hrs
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Features


  • Extreme High Brightness: Radiance exceeding 40 mW/mm².sr. nm (wavelength dependent) for fastest measurements.

  • Broadband Spectrum: Wide spectral coverage from 170 nm to 2100 nm for versatile applications.

  • Very Low Noise: Ensures precise and repeatable measurement results.

  • Dual or Single Beam Output: Integrated retro-reflector for flexible optical configurations.

  • Compact Lamphouse with Water Cooling: Enhances operational stability and extends lamp life.

  • Electrodeless Operation: Provides ultra-long lifetime with reduced maintenance costs.

  • Electronic Output Control: Enables adjustable light attenuation for controlled illumination.

  • Ultra-Clean Construction: Maintains long-term performance and reliability.

Applications


  • Semiconductor Metrology & Inspection: Provides stable, high-brightness illumination for precise wafer analysis.

  • UV-Vis-NIR Spectroscopy: Ideal for broadband spectroscopic measurements requiring flat, stable output.

  • Monochromator Source: Serves as a reliable illumination source for monochromator-based systems.

  • Photoemission Electron Microscopy (PEEM): Enables high-resolution imaging with broadband excitation.

  • Materials Characterization: Supports analytical techniques across UV to NIR ranges for materials research.

  • Advanced Imaging: Provides consistent high-intensity illumination for microscopic and macroscopic imaging.

  • Thin Film Measurements: Ensures accurate optical analysis in thin-film deposition and characterization.