Verifire HD Interferometer System
Description
ZYGO's Verifire™ HD interferometer system provides fast high-resolution measurements of flat or spherical surfaces, and transmitted wavefront measurement of optical components and assemblies. The interferometric cavity length is precisely modulated while a high-speed camera captures several fringe images, which are analyzed by the software to create a highly detailed measurement of the part being tested.
Verifire HD Interferometer System
Specifications |
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|---|---|
| Interferometer Configuration: | Fizeau Interferometer |
| Light Source: | Not Specified |
| Output Polarization: | Circular, Elliptical, Random |
| RMS Repeatability: | Not Specified |
| RMS Precision: | Not Specified |
Features
5.3 megapixel camera
Point source or coherent noise reduction (artifact suppression)
Ultra-precise phase measuring interferometry
Resolves mid-spatial frequency surface features
QPSI™ technology provides reliable measurements in production environments
Proprietary long-life powerful laser
For pricing, technical or any other questions please contact the supplier
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Frequently Asked Questions
No, calibration or special setup is required for QPSI technology. A simple change of a menu option enables/disables QPSI technology.
The key features of the Verifire HD interferometer system include a 5.3 megapixel camera, ultra-precise phase measuring interferometry, mid-spatial frequency surface feature resolution, QPSI technology for reliable measurements in production environments, and a proprietary long-life powerful laser.
QPSI technology is vibration tolerant interferometry that eliminates ripple and phase noise caused by common sources of vibration such as grinding and polishing equipment, motors, pumps, blowers, and personnel. It enables the Verifire HD system to be used right on the production floor without the hassle and expense of vibration isolation tables.
The Mx software is ZYGO's proprietary analysis software that offers a wide range of operational features.
The Verifire HD interferometer system is used for fast high-resolution measurements of flat or spherical surfaces, and transmitted wavefront measurement of optical components and assemblies.