NSLI-543-2 N-Slit Laser Interferometer
Description
Based on multiple-prism beam expansion and digital detection the N-slit interferometer allows for the rapid interferometric characterization of transmission optical surfaces in general. A significant advance over traditional point-by-point incoherent microdensitometers and point-by-point incoherent microscopes.
NSLI-543-2 N-Slit Laser Interferometer
Specifications |
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|---|---|
| Interferometer Configuration: | Not Specified |
| Light Source: | 543nm |
| Output Polarization: | Not Specified |
| RMS Repeatability: | Not Specified |
| RMS Precision: | Not Specified |
Applications
- Arrays of micro holes and/or micro nozzles
- Biomedical and organic molecular arrays
- Crystalline surfaces
- Molecular, and digital, imaging surfaces
- Optical surfaces
- Textiles
- Transmission gratings
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How to order?
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Ships from:
United States
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Frequently Asked Questions
Yes, the NSLI are manufactured with all US made optical components.
The specific applications of the N-slit interferometer include characterization of arrays of micro holes and/or micro nozzles, biomedical and organic molecular arrays, crystalline surfaces, molecular and digital imaging surfaces, textiles, detection of clear air turbulence at airport’s runway thresholds, forensic science, optical metrology of surfaces and transmission gratings, and secure space-to-space interferometric communications.
The beam dimension of the NSLI-632-1 model is 30 × 25000 μm.
The N-slit interferometer is used for the rapid interferometric characterization of transmission optical surfaces in general.
The wavelength of the NSLI-543-2 model is 543 nm.