NSLI-594-1 N-Slit Laser Interferometer
Description
Based on multiple-prism beam expansion and digital detection the N-slit interferometer allows for the rapid interferometric characterization of transmission optical surfaces in general. A significant advance over traditional point-by-point incoherent microdensitometers and point-by-point incoherent microscopes.
NSLI-594-1 N-Slit Laser Interferometer
Specifications |
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|---|---|
| Interferometer Configuration: | Not Specified |
| Light Source: | 594nm |
| Output Polarization: | Not Specified |
| RMS Precision: | Not Specified |
Applications
- Arrays of micro holes and/or micro nozzles
- Biomedical and organic molecular arrays
- Crystalline surfaces
- Molecular, and digital, imaging surfaces
- Optical surfaces
- Textiles
- Transmission gratings
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Frequently Asked Questions
The specific applications of the N-slit interferometer include characterization of arrays of micro holes and/or micro nozzles, biomedical and organic molecular arrays, crystalline surfaces, molecular and digital imaging surfaces, textiles, detection of clear air turbulence at airport's runway thresholds, forensic science, optical metrology of surfaces and transmission gratings, and secure space-to-space interferometric communications.
The beam dimension of the NSLI-632-2 model is 30 × 50000 μm.
The literature related to the N-slit interferometer includes Quantum mechanical description of N-slit interference phenomena, High Power Dye Lasers, On a generalized interference equation and interferometric measurements, Electro-optical interferometric microdensitometer system, Secure interferometric communications in free space, and Secure interferometric communications in free space: enhanced sensitivity for propagation in the metre range.
The N-slit interferometer is used for the rapid interferometric characterization of transmission optical surfaces in general.
The wavelength of the NSLI-594-1 model is 594 nm.