Hinds Instruments Inc
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Frequently Asked Questions

The Exicor OIA Premier Birefringence Measurement System is used for evaluating lenses, parallel faced optics, and curved optics at normal and oblique incident angles.

The Exicor OIA system is built on Hinds Instruments' award-winning Photoelastic Modulator (PEM) based Birefringence Measurement technology.

The data obtained from the Exicor OIA system can be used to evaluate birefringence, fast axis orientation, and theoretical residual stress.

The Exicor OIA system features automatic scan of parallel flats and spherical lens types, 2D maps of retardation and fast axis orientation, UV and laser light enclosure with safety interlocks, and a user work station with computer and monitor.

The Exicor OIA system has been selected by the world leaders in lithographic lens blanks and finished lenses for evaluating optical birefringence in research and production.

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