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Optical Surface Analyzers

Centration Testing Instrument
CSRayzer Optical Technology
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Centration Testing Instrument
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High-precision centration test devices, the product group represents the global standard for optical centration testing. With its extremely high degree of centration accuracy and integrated operation, systems are indispensable in modern optics productions. It makes no difference whether the sample has a small or very large diameter, ...

Specifications
Magnification: CCDTV-X10 Objective lens 10X
Targeting Type: CROSS
Moving Type: Electric type
Measurable Lens Max. Diameter: 180mm
Measurable Lens Focal Length: ±500mm
Data Sheet
LIGHTSpEED Unpatterned Surface Inspection Solution
FOGALE Nanotech
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LIGHTSpEED Unpatterned Surface Inspection Solution
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The LIGHTSpEED is the first unpatterned surface inspection solution that combines darkfield inspection and advanced Synchronous Doppler Detection Technology to capture nanometer scale defects on all kind of wafers. As a part of the modular LIGHTsEE series from UnitySC the LIGHTSpEED can be used as a stand-alone tool or as part of a ...
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TMAP-AP Metrology Solution For 3D IC-TSV Process Control
FOGALE Nanotech
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TMAP-AP Metrology Solution For 3D IC-TSV Process Control
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The TMAP-AP  is the complete metrology solution for 3D IC/TSV process control with the best balance between performance, throughput and cost of ownership (CoO). The TMAP-AP measure multiple layer stacks and differentiate them in the order they are placed. Even under highly warped conditions, the TMAP Series’ state of ...
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TMAP NST3D Non-Contact Full Field Metrology Solution
FOGALE Nanotech
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TMAP NST3D Non-Contact Full Field Metrology Solution
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The TMAP NST is a non contact full field metrology solution based on optical microscopy enabling surface topography measurements at the nano scale. The TMAP NST  is pushing the boundaries of conventional microscopy with performances that stretch beyond contact profilometry and into the AFM space.
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Candela 8520 High Sensitivity High Throughput Wafer Inspection Tool
KLA
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Candela 8520 High Sensitivity High Throughput Wafer Inspection Tool
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The Candela® 8520 2nd generation integrated surface and photoluminescence inspection system is designed for advanced characterization of substrate and epitaxial defects for the power device market and related applications. Implementation of automated wafer inspection with statistical process control (SPC) methodology can ...
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Candela 8720 High Sensitivity Wafer Inspectiont Tool
KLA
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Candela 8720 High Sensitivity Wafer Inspectiont Tool
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The Candela® 8720 advanced surface inspection system captures a variety of mission-critical substrate and epitaxial defects for the LED, photonics, communications and other compound semiconductor markets. Implementation of automated wafer inspection with statistical process control (SPC) methodology can significantly cut yield ...
Data Sheet
Candela 8420 Optical Surface Analyzer
KLA
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Candela 8420 Optical Surface Analyzer
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The Candela® 8420 system serves the photonics, LED, commu- nications and other compound semiconductor markets. Candela 8420 uses classic Candela technology of multi-channel detection and rule-based defect binning to perform advanced inspection for determination of yield impacting defects on blanket wafers across multiple material ...
Data Sheet
There are 7 different Optical Surface Analyzers from suppliers and manufacturers listed in this category. In just a few clicks you can compare different Optical Surface Analyzers with each other and get an accurate quote based on your needs and specifications. Please note that the prices of Optical Surface Analyzers vary significantly for different products based on various factors including technical parameters, features, brand name, etc. Please contact suppliers directly to inquire about the details and accurate pricing information for any product model. Simply navigate to the product page of interest and use the orange button to directly reach out to the respective supplier with one click.