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- Birefringence Measurement System
- GEN SERIES BIREFRINGENCE MEASUREMENT SYSTEM
GEN SERIES BIREFRINGENCE MEASUREMENT SYSTEM
OVERVIEW
The Exicor® GEN5 and GEN6 systems are large format sample measurement units built on the core Exicor low level birefringence measurement technology and precision automated motion control elements. These platforms provide unsurpassed low level birefringence measurements to support the precision characterization of display related materials for the LCD industry (Generation 5+ compensation films and glass substrates, etc.) The systems are backward compatible with earlier generation models. The system designs are scalable to larger materials and can easily be adapted to other non-display material applications such as low tech sheeting materials and commercial window glass. With a scannable area of 1150 mm x 1375 mm, the GEN5 system uses a patented high tension wire grid stage to maximize the measurable area on the sample while minimizing the sample sag and flexure.
With the optional high speed Scan In Motion™ (SIM) option, the system can characterize a sample in a fraction of the time a normal scanning would take (as little as 12 minutes, estimated).
SPECIFICATION
- Retardation Range: 0.005 - 300 nm
- Max Measurement Rate: 100 PPS
- Light Source Wavelength: 632.8 nm
- Measurement Area Length: 1 mm
- Measurement Area Width: 1 mm
Applications
- Quality control metrology
- Low-level birefringence measurements of
- Display glass
- LCD
- Large irregular shaped planar glass and plastic
- Plastic film
KEY FEATURES
- Unprecedented sensitivity in low-level birefringence measurement
- Simultaneous measurement of birefringence magnitude and angle
- Precision repeatability
- High-speed measurement
- No moving parts in the optical system
- Automatic mapping of variable-sized optical elements
- Photoelastic modulator technology
- Simple, user-friendly operation

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