GEN SERIES BIREFRINGENCE MEASUREMENT SYSTEM

The Exicor® GEN5 and GEN6 systems are large format sample measurement units built on the core Exicor low level birefringence measurement technology and precision automated motion control elements.  These platforms provide unsurpassed low level birefringence measurements to support the precision characterization of display related materials for the LCD industry (Generation 5+ compensation films and glass substrates, etc.)  The systems are backward compatible with earlier generation models.  The system designs are scalable to larger materials and can easily be adapted to other non-display material applications such as low tech sheeting materials and commercial window glass. With a scannable area of 1150 mm x 1375 mm, the GEN5 system uses a patented high tension wire grid stage to maximize the measurable area on the sample while minimizing the sample sag and flexure. 

With the optional high speed Scan In Motion™ (SIM) option, the system can characterize a sample in a fraction of the time a normal scanning would take (as little as 12 minutes, estimated).