Litos Stress-Test Platform for Degradation Analysis of LEDs

Specifications

Stress Channels: 16 Channels, 32 Channels
Number Of Chambers: 4
Maximum Current: 60 mA
Connectivity Options: USB
Humidity Sensors: Individual for each chamber
Sample Holder: Custom-made according to customer layout
Functionality: JV(L), in-situ spectral measurements (PL and EL)
Electrical Independence: All channels
Temperature Controller: On stage
Voltage Range: -9V to 9V
Temperature Range: 0 - 85 °C
Sample Size: Up to 20mm diameter
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Features

  • 16 or 32 individual channels for addressing multiple LEDs in parallel
  • 4 chambers with individual humidity sensors
  • Customized sample holder design
  • Litos/Paios Integration for in-depth degradation analysis
  • User-friendly software for automatic measurement control and parameter extraction
  • Functionality includes JV(L), in-situ spectral measurements (PL and EL)
  • All channels are electrically independent
  • Temperature controller on stage
  • Independent stressing and characterization of up to 32 pixels
  • Min/Max Voltages: -9V to 9V
  • Maximum current: 60mA/channel
  • Temperature Range: 0 - 85°C
  • Sample Size: Up to 20mm diameter
  • Computer Connection: USB
  • Constant current, constant luminance, constant voltage
  • Compatible with Bottom and Top Emitting LEDs*
  • Individual photodiode for each LED under test

Applications

  • Degradation analysis of LEDs
  • Study of degradation mechanisms in organic, perovskite, and quantum-dots-based LEDs
  • Characterization of LED stability lifetime
  • Testing of up to 8 LEDs simultaneously in each chamber