SOC750 Midwave Infrared Hyperspectral Imager
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Ships from:
United States
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Sold by:
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On FindLight:
since 2020
Description
The 410-DHR is a groundbreaking portable device developed through a collaboration between the U.S. Naval Air Systems Command and Surface Optics, with significant contributions from the Naval Research Lab (NRL) and the National Institute of Standards and Technology (NIST). This innovative tool addresses the critical need for a portable solution to verify the optical properties of large objects in the field. Designed with precision and efficiency in mind, the 410-DHR measures the integrated surface reflectance of a surface at two specific angles of incidence, 20° and 60°, across six discrete wavelength bands ranging from 0.9 to 12 μm.
One of the standout features of the 410-DHR is its portability and ease of use, making it an ideal choice for fieldwork. The device's built-in touchscreen display and user-friendly operating software facilitate straightforward calibration, measurement setup, and data management, whether in the field or a laboratory setting. This ensures that users can quickly and accurately gather the necessary data without the need for additional equipment or complex setups.
Engineered for versatility, the 410-DHR is capable of measuring both curved and large objects without requiring special jigs or fixtures. This adaptability is complemented by its fast calibration process, which takes only one minute at the start of a measurement session, and its rapid data collection capability, delivering results in 10 seconds or less. These features make the 410-DHR an indispensable tool for professionals who require reliable and immediate data on the optical properties of various surfaces.
With its robust design and advanced functionality, the 410-DHR is a testament to the power of collaborative innovation, offering a state-of-the-art solution for those in need of precise optical property verification in diverse environments. Its compliance with US export regulations further underscores its reliability and global applicability, making it a trusted choice for experts in the field.
SOC750 Midwave Infrared Hyperspectral Imager
Specifications |
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|---|---|
| Imaging Mode: | Electroluminescence (EL), Raman, Photoluminescence (PL), Diffuse Reflectance (DR) |
| Excitation Wavelength: | Not Available |
| Spectral Range (Raman Imaging): | Custom |
| Spectral Range (PL, EL, DR Imaging): | Custom |
| Spectral Resolution (Raman Imaging): | Custom |
| Spectral Resolution (PL, EL, DR Imaging): | Custom |
| Spatial Resolution: | Nanometer Range |
Features
- Portable Design: Developed in collaboration with U.S. Naval Air Systems Command and Surface Optics, the 410-DHR is designed for field use, allowing verification of optical properties of large objects.
- Multi-Angle Measurements: Measures integrated surface reflectance at two angles of incidence (20° and 60°) for comprehensive data collection.
- Wide Spectral Range: Covers six discrete wavelength bands from 0.9 to 12 μm, ensuring versatile application across various materials.
- Quick and Efficient: Fast calibration in one minute and data collection in 10 seconds or less, optimizing time in the field.
- Immediate Data Access: Features a built-in touchscreen display for easy data review and management.
- Optional Grazing Angle Model: Available with an 80° incident angle for specialized measurements.
- High Accuracy and Repeatability: Offers accuracy of +/- 0.03 and repeatability of ±0.005 units.
- Adaptable Sample Measurement: Capable of measuring flat samples (≥ 0.5 in. diameter) and curved samples (6 in. convex; 12 in. concave).
- Temperature Range: Operates effectively in ambient temperatures or with samples heated/cooled to 0 - 100º C.
- Portable Power: Runs for 2 hours on a single battery, with easy replacement for continuous operation.
Applications
- IR Signature: Analyze and verify the infrared signature of various surfaces.
- Stealth Coatings / Low Observables: Evaluate coatings designed to reduce detectability.
- Thermal Modeling: Support thermal analysis and modeling by providing accurate emissivity data.
- Thermal Camera Calibration: Calibrate thermal cameras using precise emissivity measurements.
- Emissivity of Wafer Fabrication: Measure and verify the emissivity of wafers during fabrication processes.
Frequently Asked Questions
The SOC750-HB can be used in demanding applications like gas leak detection, spectral signature measurements, and chemical species identification and quantification.
The SOC750-HB is a real time, military grade, remote sensing MWIR hyperspectral imaging system.
The spectral resolution is 73 nm.
The system’s spectral response is medium wave-infrared from 2-5 microns.
The SOC750-HB imager is supported by SOC’s custom HSAnalysis3 software with a user-friendly GUI.