I-MON High Speed Interrogation Monitors I-MON 256 HS

Specifications

Wavelength Range: 1525 – 1570 nm
Wavelength Fit Resolution: 0.5 pm
Wavelenght Linearity: 5 pm
Dynamic Range: 30 dB
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Features


  • High Measurement Frequency: Achieve spectrum monitoring at line scan rates up to 35 kHz, ideal for demanding FBG sensing systems.

  • Broad Wavelength Ranges: Supports wavelength ranges from 1525 to 1595 nm, allowing for versatile applications.

  • High Resolution: Offers <0.5 pm wavelength fit resolution, ensuring precise measurements.

  • Large Dynamic Range: Provides a dynamic range of 30 dB, accommodating various measurement conditions.

  • Compact Size: The monitor measures 124 x 94 x 59 mm, making it suitable for space-constrained environments.

  • No Moving Parts: Ensures reliability and durability with a design that eliminates moving components.

  • GigE Interface: Facilitates easy setup and data acquisition with a laptop, offering seamless integration.

  • External Synchronization: Input enables precise timing for accurate measurements.

  • Temperature Range: Operates efficiently within 0 – 50 Degree C, ensuring versatility across environments.

  • Applications: Suitable for vibration analysis, temperature measurements, pressure monitoring, and strain measurements.

  • Stand-Alone or OEM Modules: Can function independently or as part of OEM interrogation monitor modules.

Applications


  • Vibration Analysis: Real-time monitoring of structural dynamics

  • Temperature Measurements: Accurate thermal sensing with FBG sensors

  • Pressure Monitoring: High-resolution pressure detection in industrial systems

  • Strain Measurements: Precise strain mapping for material testing and structural health