XPLOR-100 3D Optical Inspection Station
Description
XPLOR 100 is a state of the art, fully automated metrology device designed for measurement and analysis of bubbles and inclusions for optical substrates in the Visible and NIR wave-bands.
XPLOR-100 3D Optical Inspection Station
Specifications |
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| Index Measurement Range: | 400-1000 |
| Accuracy: | -0.001-0.001 |
| Repeatability: | -0.001-0.001 |
For pricing, technical or any other questions please contact the supplier
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How to order?
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Ships from:
United States
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On FindLight:
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Frequently Asked Questions
No, the XPLOR-100 is specifically designed for measurement and analysis of bubbles and inclusions for optical substrates in the Visible and NIR wave-bands.
Yes, the XPLOR-100 is a fully automated metrology device.
Yes, a datasheet for the XPLOR-100 is available.
The XPLOR-100 is used for measurement and analysis of bubbles and inclusions for optical substrates in the Visible and NIR wave-bands.
The XPLOR-100 can measure and analyze bubbles and inclusions for optical substrates in the Visible and NIR wave-bands.