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Non-Contact Inspection
Microscopes
AFM
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CombiScope 1000 Scanning Probe Microscope
AIST-NT Inc
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The CombiScope 1000 Scanning Probe Microscope (SPM) is an advanced research instrument that provides the entry path for researchers in materials science, biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nanoscale structures and near-field optical properties investigation, ...
Max Sample Size:
25 mm
Min Working Distance:
25 mm
Scan Range (X):
100 um
Scan Range (Y):
100 um
Scan Range (Z):
20 um
Data Sheet
NaniteAFM
Nanosurf AG
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The surface morphology is an important property for many high-tech surfaces with features that can go down to a few nanometers and surface roughness below the nanometer. With AFM such features can be readily analyzed under ambient conditions. Most AFMs are limited in the type and size of samples they can handle. The NaniteAFM by ...
Max Sample Size:
-- mm
Min Working Distance:
-- mm
Scan Range (X):
110 um
Scan Range (Y):
110 um
Scan Range (Z):
22 um
Data Sheet
LensAFM
Nanosurf AG
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he Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments. The LensAFM not only provides 3D surface topography information, but can ...
Max Sample Size:
-- mm
Min Working Distance:
-- mm
Scan Range (X):
110 um
Scan Range (Y):
110 um
Scan Range (Z):
22 um
Data Sheet
Alphacen 300
Nanosurf AG
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Nanosurf is the market leader for custom developed systems for large and heavy samples. Over the past years our team has built a substantial knowledge base developing these custom stages for various customers. Utilizing this vast body of knowledge, we have now developed a standard product for large samples up to 300 mm or heavy ...
Max Sample Size:
300 mm
Min Working Distance:
-- mm
Scan Range (X):
10 um
Scan Range (Y):
10 um
Scan Range (Z):
10 um
Data Sheet
SpectraView 2500 Compact Ultra-Low Noise Scanning Probe Microscope
Nanonics Imaging Ltd
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Integrating scattering techniques with ultrasensitive SPM/AFM, the SpectraView MV2500 (TM) is a breakthrough in nanochemical analysis: IR-ThZ-Raman-AFM. The SpectraView 2500 (TM) is a compact ultra-low noise scanning probe microscope, offering the highest of resolution and force sensitivity. It offers all modes of AFM, ...
Max Sample Size:
100 mm
Min Working Distance:
0.085 mm
Scan Range (X):
0.085 um
Scan Range (Y):
0.085 um
Scan Range (Z):
0.085 um
Data Sheet
SEM And FIB Integration With Scanning Probe Microscopy
Nanonics Imaging Ltd
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The AFM SEM/FIB is an award-winning SPM/NSOM system seamlessly integrated with SEM/FIB. This instrument is based on a revolutionary design that provides open access to the SEM/FIB beams for complete integration of SPM, SEM and FIB. The SPM probe does not obscure the electronic or ion beam axis and also sits at the eucentric ...
Max Sample Size:
0.014 mm
Min Working Distance:
-- mm
Scan Range (X):
0.35 um
Scan Range (Y):
0.35 um
Scan Range (Z):
0.35 um
Data Sheet
Hydra Bio AFM with Vivid Imaging Soft Touch AFM Mode
Nanonics Imaging Ltd
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Nanonics, the leading provider of cutting-edge AFM technology, is proud to present its newest breakthrough in bio atomic force microscopy: the Hydra BioAFM(TM) featuring VISTA(TM) (Vivid Imaging Soft Touch AFM) mode. This innovation offers ultrasensitive single pN force mapping combined with the benefits of super-resolution ...
Max Sample Size:
0.09 mm
Min Working Distance:
-- mm
Scan Range (X):
90 um
Scan Range (Y):
90 um
Scan Range (Z):
-- um
Data Sheet
Cypher ES Polymer Edition AFM
Oxford Instruments
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The Cypher ES Polymer Edition is a special configuration of the Cypher ES AFM tailored to excel in polymer science research. It shares the same extraordinary performance and versatility as the Cypher ES, but comes standard with blueDrive photothermal excitation, three powerful techniques from our NanoMechPro toolbox for ...
Max Sample Size:
-- mm
Min Working Distance:
-- mm
Scan Range (X):
3 um
Scan Range (Y):
9 um
Scan Range (Z):
-- um
Data Sheet
Cypher ES Environmental AFM
Oxford Instruments
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The Asylum Research Cypher ES builds on the exceptional performance of the Cypher S and adds full environmental control features. The same high resolution, speed and stability are maintained while easily operating in controlled gas or liquid environments, at temperatures from 0-250°C, and in some of the harshest chemical ...
Max Sample Size:
-- mm
Min Working Distance:
-- mm
Scan Range (X):
3 um
Scan Range (Y):
9 um
Scan Range (Z):
-- um
Data Sheet
Cypher S AFM Microscope
Oxford Instruments
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The Asylum Research Cypher S is the base model of the Cypher AFM microscope family. The Cypher S was the first commercially available fast-scanning AFM, and the Cypher family AFMs remain the only full-featured fast-scanning AFMs that are compatible with a complete range of modes and accessories. Cypher AFMs have also earned a ...
Max Sample Size:
-- mm
Min Working Distance:
-- mm
Scan Range (X):
3 um
Scan Range (Y):
9 um
Scan Range (Z):
-- um
Data Sheet
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