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LensAFM
OVERVIEW
he Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments. The LensAFM not only provides 3D surface topography information, but can be used to analyze various physical properties of a measurement sample as well.
SPECIFICATION
- Max Sample Size: -- mm
- Min Working Distance: -- mm
- Scan Range (X): 110 um
- Scan Range (Y): 110 um
- Scan Range (Z): 22 um
KEY FEATURES
- Mountable on virtually any optical microscope or 3D optical profilometer
- Equipped with an objective lens for a clear view of sample and cantilever
- Simple sample positioning using the optical microscope position manipulators Integrated motor for automated cantilever approach: Just bring your sample into optical focus and let the LensAFM do the rest
- Large AFM Z-range allows measurement of high structures
- Wide range of AFM modes available through the C3000 controller
- Simply intuitive: Nanosurf’s well-known “ease of use” will have you performing measurements in minutes!
Nanosurf AG
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