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NaniteAFM
OVERVIEW
The surface morphology is an important property for many high-tech surfaces with features that can go down to a few nanometers and surface roughness below the nanometer. With AFM such features can be readily analyzed under ambient conditions. Most AFMs are limited in the type and size of samples they can handle. The NaniteAFM by Nanosurf is the market leading solution for AFM integration with least restriction to the sample dimensions. The NaniteAFM has a tip-scanner, two inspection video cameras and an on-board approach motor in an exceptionally small footprint. It contains everything needed to operate independently, paving the way for easy integration: All you need is 300 cm3 in space and a stable docking site to mount the AFM.
SPECIFICATION
- Max Sample Size: -- mm
- Min Working Distance: -- mm
- Scan Range (X): 110 um
- Scan Range (Y): 110 um
- Scan Range (Z): 22 um
Applications
Ideal for custom integration
Automate serial measurements
Copes with large, heavy, or curved samples

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