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Frequently Asked Questions

The FAST SDD uses a CMOS preamplifier and MOSFET instead of a JFET, resulting in lower capacitance and improved resolution at short peaking times.

The FAST SDD has a 25 mm2 active area collimated to 17 mm2, 122 eV FWHM resolution at 5.9 keV, count rates over 1,000,000 CPS, and a high peak-to-background ratio of 26,000/1.

The FAST SDD is suitable for ultra-fast benchtop and handheld XRF analyzers, scanning/mapping of samples in an SEM, on-line process control, and X-Ray Sorting Machines.

The improved resolution of the FAST SDD allows for isolation/separation of fluorescent X-rays with close energy values, preventing peak overlap and enabling better identification of elements.

The FAST SDD has lower noise, lower leakage current, better charge collection, and uniformity from detector to detector, making it the best performing silicon drift detector available.

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