EDS SEM Applications FAST SDD And C2 Window
Description
Amptek is pleased to offer our improved line of silicon drift detectors (SDDs) for energy dispersive spectroscopy (EDS) use within scanning electron microscopes (SEMs). Using our proprietary Patented “C-Series” silicon nitride (Si3N4) X-ray windows, the low-energy response of our FAST SDD® extends down to beryllium (Be). The FAST SDD® with its high intrinsic efficiency is ideal for EDS, which is also known as energy dispersive X-ray spectroscopy (EDX or XEDS) and energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA).
EDS SEM Applications FAST SDD And C2 Window
Specifications |
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|---|---|
| Active Area (horizontal): | 25 mm |
| Active Area (vertical): | 25 mm |
| Image Resolution (actual): | -- lp/mm |
| Image Size (horizontal): | -- Pixels |
| Image Size (vertical): | -- Pixels |
| Image Size (vertical): | -- Pixels |
| Pixel Size (square): | -- um |
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Frequently Asked Questions
The FAST SDD® with C2 Window is designed for energy dispersive spectroscopy (EDS) use within scanning electron microscopes (SEMs).
The low-energy response of the FAST SDD® extends down to beryllium (Be).
Energy dispersive spectroscopy (EDS) is also known as energy dispersive X-ray spectroscopy (EDX or XEDS) and energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA).
The FAST SDD® is available in 25 mm or 70 mm X-123 package.
The transmission efficiency of the C2 Window varies for different elements, ranging from 13% for beryllium (Be) to 81.8% for silicon (Si).