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- EDS SEM Applications FAST SDD And C2 Window
EDS SEM Applications FAST SDD And C2 Window
OVERVIEW
Amptek is pleased to offer our improved line of silicon drift detectors (SDDs) for energy dispersive spectroscopy (EDS) use within scanning electron microscopes (SEMs). Using our proprietary Patented “C-Series” silicon nitride (Si3N4) X-ray windows, the low-energy response of our FAST SDD® extends down to beryllium (Be). The FAST SDD® with its high intrinsic efficiency is ideal for EDS, which is also known as energy dispersive X-ray spectroscopy (EDX or XEDS) and energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA).
SPECIFICATION
- Active Area (horizontal): 25 mm
- Active Area (vertical): 25 mm
- Image Resolution (actual): -- lp/mm
- Image Size (horizontal): -- Pixels
- Image Size (vertical): -- Pixels
- Image Size (vertical): -- Pixels
- Pixel Size (square): -- um
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