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Frequently Asked Questions

The FAST SDD® with C2 Window is designed for energy dispersive spectroscopy (EDS) use within scanning electron microscopes (SEMs).

The low-energy response of the FAST SDD® extends down to beryllium (Be).

Energy dispersive spectroscopy (EDS) is also known as energy dispersive X-ray spectroscopy (EDX or XEDS) and energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA).

The FAST SDD® is available in 25 mm or 70 mm X-123 package.

The transmission efficiency of the C2 Window varies for different elements, ranging from 13% for beryllium (Be) to 81.8% for silicon (Si).

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