NanoCam Sq Dynamic Surface Profiler
Description
The NanoCam Sq dynamic optical profiler measures surface roughness on supersmooth optics and precision surfaces. The non-contact NanoCam Sq is a vast improvement over the messy replication methods required with traditional workstation optical profilers and provides excellent portability for measuring large optics.
By enabling on-machine roughness metrology the NanoCam Sq increases throughput. By eliminating the need to transport expensive, mission-critical optics, NanoCam reduces the risk of damage.
The NanoCam Sq optical profilometer utilizes Dynamic Interferometry®, incorporating a high-speed optical sensor that measures thousands of times faster than traditional optical profilers. Because acquisition time is so short, the NanoCam Sq can measure despite vibration, making it possible to mount the instrument in polishing equipment, on a gantry or on a robot end effector.
The NanoCam Sq is compact and lightweight enough to be placed directly on large optics. With this freedom of positioning the NanoCam can measure surface finish at any location on a large optic.
The NanoCam Sq Dynamic Optical Profiler includes 4Sight advanced analysis software. Industry-leading 4Sight reports ISO 25178 surface roughness parameters (S parameters) and provides extensive 2D and 3D analysis options, data filtering, masking, database and import/export functions.
NanoCam Sq Dynamic Surface Profiler
Specifications |
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|---|---|
| Measurement Technique: | Confocal Microscopy |
| Light Source Type: | Pulsed LED |
| Light Source Wavelength: | 460 nm |
| Sample Reflectivity: | 1-100% |
| Vertical Range: | 115 nm |
| RMS Repeatability: | <0.005 nm |
| RMS Precision: | <0.1nm |
| Magnification: | 5x, 10x, 20x, 50x |
| Application: | Surface Roughness, 3D Imaging |
| Software Compatibility: | Windows |
| Z-axis Sensing Technology: | Not Specified |
Features
- Vibration-insensitive Dynamic operation
- 1.6 MP, 12-Bit, Low Noise Camera
- 460 nm Pulsed LED Source
- Integrated Alignment System
- ISO 25178 Surface Roughness Parameters
- Motorized, Joystick Controlled Tip/Tilt/Z Tripod
- Handheld, Workstation, Gantry or Robot Mounted
Applications
- Surface roughness of small and large coated/uncoated optics
- On-machine surface roughness metrology
- On-optic measurement of large optics
- Process control for polishing operations
For pricing, technical or any other questions please contact the supplier
- No registration required
- No markups, no fees
- Direct contact with supplier
Contact Supplier
How to order?
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Ships from:
United States
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Sold by:
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On FindLight:
since 2017
Frequently Asked Questions
The NanoCam Sq dynamic optical profiler is used to measure surface roughness on supersmooth optics and precision surfaces.
The NanoCam Sq is a non-contact instrument that eliminates the need for messy replication methods required by traditional workstation optical profilers.
Yes, the NanoCam Sq can measure surface roughness despite vibration, making it possible to mount the instrument in polishing equipment, on a gantry or on a robot end effector.
The NanoCam Sq includes 4Sight advanced analysis software, which reports ISO 25178 surface roughness parameters (S parameters) and provides extensive 2D and 3D analysis options, data filtering, masking, database and import/export functions.
The NanoCam Sq can be used for surface roughness measurement of small and large coated/uncoated optics, on-machine surface roughness metrology, on-optic measurement of large optics, and process control for polishing operations.