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<0.001 nm Optical Surface Profiler

TMS-150 TopMap Metro.Lab White-Light Interferomter
Polytec GmbH
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TMS-150 TopMap Metro.Lab White-Light Interferomter
The TMS-150 TopMap Metro.Lab from Polytec is a precision white-light interferometer with a large vertical measurement range, large field of view and nanometer resolution. The compact 3D workstation easily measures without contact flatness, step height and parallelism of large surfaces and structures on even soft and delicate materials

Specifications
Light Source Type: Pulsed LED
Light Source Wavelength: 525 nm
Sample Reflectivity: 1-1%
Vertical Range: 70000000 nm
RMS Repeatability: <0.001 nm
...
Data Sheet
TMS-350L TopMap In.Line Fast Surface Characterization Setup
Polytec GmbH
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TMS-350L TopMap In.Line Fast Surface Characterization Setup
The compact design of the TMS-350 TopMap In.Line enables an elegant and easy integration into the production line. The system measures the form deviation, such as flatness or waviness, without contact, reliably and within short cycle times. Since no objectives are needed, collisions and damage to the optics or sample are avoided. The ...

Specifications
Light Source Type: Pulsed LED
Light Source Wavelength: 525 nm
Sample Reflectivity: 1-1%
Vertical Range: 500000 nm
RMS Repeatability: <0.001 nm
...
Data Sheet
CVS trevista CAM
STEMMER IMAGING
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CVS trevista CAM
Trevista CAM closes the gap between simple applications for intelligent cameras and demanding surface inspection tasks. It is based on the patented trevista illumination in combination with a powerful smart camera, pre-loaded witheither Teledyne DALSA\'s Inspect or Sherlock machine vision software. The CVS trevista CAM is ideal ...

Specifications
Light Source Type: CW LED
Light Source Wavelength: -- nm
Sample Reflectivity: 1-1%
Vertical Range: -- nm
RMS Repeatability: <0.001 nm
...
Data Sheet
CVS trevista FLAT
STEMMER IMAGING
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CVS trevista FLAT
The powerful CVS trevista FLAT takes the trevista dome geometry and reduces it to a flat and compact format. Theillumination controller is integrated into the unit, which makes integration into the inspection system easy andmakes price-sensitive applications possible. Thanks to the flat design, not only the surfaces of ...

Specifications
Light Source Type: CW LED
Light Source Wavelength: -- nm
Sample Reflectivity: 1-1%
Vertical Range: -- nm
RMS Repeatability: <0.001 nm
...
Data Sheet
Form Talysurf PGI Optics
Taylor Hobson Precision
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Form Talysurf PGI Optics
Taylor Hobson Form Talysurf PGI (Phase Grating Interferometer) - contact stylus profilometer/Equipment measures large sag lens (surfaces form) plastic lenses, small components, IR glass and crystals up to 300mm diameter with high accuracy and it is a number one instrument for optics manufacturers. Following its first release in 1984, ...

Specifications
Light Source Type: Coherent Continuous Wave (CW)
Light Source Wavelength: 2 nm
Sample Reflectivity: 1-1%
Vertical Range: -- nm
RMS Repeatability: <0.001 nm
...
Data Sheet
Form Talysurf PGI Matrix
Taylor Hobson Precision
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Form Talysurf PGI Matrix
aylor Hobson Stylus Optics Profilometer: Form Talysurf PGI Matrix is an easy to set-up, test and analysis for single or multiple parts. This instrument is perfect optical surface form measurement system for fast and accurate testing of optical components up to 200 mm Diameter. A modular system, adaptable for differing budgets and ...

Specifications
Light Source Type: Coherent Continuous Wave (CW)
Light Source Wavelength: -- nm
Sample Reflectivity: 1-1%
Vertical Range: -- nm
RMS Repeatability: <0.001 nm
...
Data Sheet
Form Talysurf PGI Freeform
Taylor Hobson Precision
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Form Talysurf PGI Freeform
aylor Hobson\'s Form Talysurf PGI (Phase Grating Interferometer) is a versatile, high resolution 3D  Freeform profilometer for high precision freeform optics measurement. It performs surface finish and form analysis for freefrom optics. Taylor Hobson’s Form Talysurf® PG Freeform is underpinned by ...

Specifications
Light Source Type: Coherent Continuous Wave (CW)
Light Source Wavelength: 800 nm
Sample Reflectivity: 1-1%
Vertical Range: -- nm
RMS Repeatability: <0.001 nm
...
Data Sheet
On FindLight marketplace you will find 7 different <0.001 nm Optical Surface Profiler from suppliers around the world. With just a few clicks you can compare different <0.001 nm Optical Surface Profiler and get accurate price quotes based on your needs and quantity required. Note that some wholesale suppliers may offer discounts for large quantities. From any product page you can directly contact any vendor within seconds.