ContourX-200 3D Optical Profilometer
Description
The ContourX-200 Optical Profilometer provides the perfect blend of advanced characterization, customizable options, and ease of use for best-in-class fast, accurate, and repeatable non-contact 3D surface metrology. The gage-capable, small footprint system offers uncompromised 2D/3D high-resolution measurement capabilities using a larger FOV 5 MP digital camera and new motorized XY stage. Boasting unmatched Z-axis resolution and accuracy, the ContourX-200 provides all the industry recognized advantages of Bruker’s proprietary white light interferometry (WLI) technology without the limitations of conventional confocal microscopes and competing standard optical profilers.
ContourX-200 3D Optical Profilometer
Specifications |
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|---|---|
| Light Source Type: | CW LED, Modulated LED |
| Light Source Wavelength: | -- nm |
| Sample Reflectivity: | 0.05-100% |
| Vertical Range: | 10000000 nm |
| RMS Repeatability: | <0.01 nm |
| RMS Precision: | <0.1nm |
Features
Best Z resolution independent of magnification
Largest standard field of view
High-stability, vibration-tolerant compact design
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Frequently Asked Questions
The ContourX-200 Optical Profilometer is a non-contact 3D surface metrology instrument that provides fast, accurate, and repeatable measurements.
The key features of the ContourX-200 include best Z resolution independent of magnification, largest standard field of view, and a high-stability, vibration-tolerant compact design.
The ContourX-200 can benefit industries such as precision machining, semiconductor, ophthalmic, medical device, MEMS, and tribology.
The ContourX-200 comes complete with Vision64®, the industry's most advanced operation and analysis software. It also has the new VisionXpress™ interface for easier use and streamlined capabilities.
The ContourX-200 is robust in all surface situations, ranging from 0.05% to 100% reflectivity.