Description
Type IV aberration corrected flat field and imaging gratings are designed to focus a spectrum onto a plane surface, making them ideal for use with linear or 2-D array detectors. These gratings are produced with grooves that are neither equispaced nor parallel, and are computer optimized to form near-perfect images of the entrance slit on the detector plane.
Owing to their large optical numerical aperture and correction from aberrations, these Type IV aberration corrected flat field & imaging
gratings provide much better light collection efficiency and signal to noise ratio than traditional Type I Rowland circle concave gratings.
When an area detector such as a CCD is utilized, it is often possible to focus multiple sources onto the entrance slit and independently evaluate the spectrum from each source. These “Imaging Gratings” are nearly free from astigmatism, and therefore only one fixed optical element is required to construct an imaging spectrograph.
Flat Field and Imaging Grating 523 00 040
Specifications
Dispersion: | 36 nm/mm |
---|---|
Wavelength Range: | 300 – 1170 nm |
Spectrum Length: | 25 mm |
F/Number: | 3.2 |
Groove Density: | 138 l/mm |
Applications
- Spectrographs
- Spectroscopy
- Laser Optics
- Imaging
Frequently Asked Questions
What is the commitment to quality of HORIBA Jobin Yvon?
How are these gratings produced?
What is the difference between Type IV flat field and imaging gratings and traditional gratings?
What are Type IV aberration corrected flat field and imaging gratings used for?
What advantages do Type IV aberration corrected flat field and imaging gratings have over traditional Type I Rowland circle concave gratings?
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