Optical Surface Profilers for Precision Metrology

3D Mapping Technology

3D Mapping Technology

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Sold by: Optics for Hire Ships from: United States
Specifications
Measurement Technique: Other (not specified)
Light Source Type: Modulated Laser
Light Source Wavelength: 650 nm
Sample Reflectivity: 10 – 90 %
Vertical Range: 10 nm
Form Talysurf PGI Optics

Form Talysurf PGI Optics

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Sold by: Taylor Hobson Ships from: United States
Specifications
Measurement Technique: Other (not specified)
Light Source Type: Coherent Continuous Wave (CW)
Light Source Wavelength: 2 nm
Sample Reflectivity: 1 – 1 %
RMS Repeatability: <0.001 nm
Form Talysurf PGI Matrix

Form Talysurf PGI Matrix

Request Quote
Sold by: Taylor Hobson Ships from: United States
Specifications
Measurement Technique: Other (not specified)
Light Source Type: Coherent Continuous Wave (CW)
Sample Reflectivity: 1 – 1 %
RMS Repeatability: <0.001 nm
RMS Precision: <0.001 nm

Did You Know?

Did you know that Optical Surface Profilers are powerful metrology tools used to measure the topography and roughness of surfaces with high accuracy and precision? Optical Surface Profilers use light to create a 3D image of a sample's surface, allowing for non-contact and non-destructive measurements. They offer fast measurement speeds and high-resolution imaging, making them ideal for quality control in manufacturing, surface characterization in research and development, and failure analysis in materials science. Optical Surface Profilers can measure surface features at sub-nanometer scale, making them suitable for a wide range of applications, including microelectronics, optics, and nanotechnology. When selecting an Optical Surface Profiler, it is important to consider factors such as the sample size, measurement range, resolution, and speed to ensure the instrument meets the specific application requirements.

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Frequently Asked Questions

An Optical Surface Profiler is a non-contact metrology tool used to measure surface topography, roughness, and flatness of a sample. It uses light to scan the surface of the sample and create a 3D image of its topography.

What Are Optical Surface Profilers?

Optical Surface Profilers are non-contact instruments that use optical interferometry, confocal microscopy, or focus-variation techniques to measure 2D and 3D surface topography. These systems characterize roughness, waviness, step height, and form on reflective and semi-reflective surfaces without touching the sample.

By analyzing the interaction of light with the test surface, Optical Surface Profilers deliver quantitative height maps with nanometer to sub-micrometer vertical resolution. They are used for both R&D and production metrology across optics, semiconductors, precision machining, and thin-film applications.

Typical Specifications of Optical Surface Profilers

When reviewing Optical Surface Profilers on FindLight, you will typically encounter specifications such as:

  • Vertical resolution: from sub-nanometer to tens of nanometers, depending on technique and objective.
  • Lateral resolution: set by numerical aperture and wavelength, typically from <1 µm to several micrometers.
  • Measurement range: vertical scan ranges from a few µm up to several mm; lateral fields of view from tens of µm to several mm.
  • Surface types: polished optics, wafers, MEMS, structured surfaces, coatings, and rough machined parts.
  • Scan and acquisition modes: phase-shifting interferometry, white light interferometry, confocal scanning, or focus-variation profiling.
  • Data outputs: 3D height maps, line profiles, roughness parameters (Ra, Rq, Sa, Sq), step height analysis, and form error.

Use Cases for Optical Surface Profilers

Optical Surface Profilers are commonly used for optical component quality control (lenses, mirrors, windows), wafer and MEMS inspection, thin-film thickness and uniformity checks, precision tooling verification, and failure analysis of micro-structured surfaces. Non-contact operation is essential for fragile coatings, soft polymers, and micro-mechanical devices.

Buyer Guidance on FindLight

On FindLight, you can compare Optical Surface Profilers by vertical and lateral resolution, maximum sample size, scanning speed, supported surface types, and available analysis software. Evaluate whether you need interferometric or confocal-based Optical Surface Profilers based on surface roughness and reflectivity. Review datasheets, then contact manufacturers or distributors directly to request technical clarifications and custom configurations. All quote requests for Optical Surface Profilers can be made without registration, enabling fast supplier interaction and streamlined procurement.