NEX DE VS Energy Dispersive X-ray Fluorescence Spectrometer
Description
As a premium high performance, SMALL SPOT benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the new Rigaku NEX DE VS delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids, slurries and RoHS materials.
NEX DE VS Energy Dispersive X-ray Fluorescence Spectrometer
Specifications |
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|---|---|
| Measurement Type: | Elemental analysis |
| Lowest Level Detection (LLD) Range: | 00-00ppm |
| Resolution: | N/A eV |
Features
- Analyze ₁₁Na to ₉₂U non-destructively
- Powerful QuantEZ Windows®-based software
- High resolution camera
- 1, 3 or 10 mm analysis spot size
- Solids, liquids, alloys, powders and films
- 60kV X-ray tube for wide elemental coverage
- FAST SDD® detector for superior data
- Six automated tube filters
- Unmatched performance-to-price ratio
For pricing, technical or any other questions please contact the supplier
- No registration required
- No markups, no fees
- Direct contact with supplier
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How to order?
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Ships from:
United States
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Sold by:
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External Vendor
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Frequently Asked Questions
The NEX DE VS Energy Dispersive X-ray Fluorescence Spectrometer has a 1, 3 or 10 mm analysis spot size.
The NEX DE VS Energy Dispersive X-ray Fluorescence Spectrometer is used for elemental analysis of almost any matrix, from solids and alloys to powders, liquids, slurries and RoHS materials.
The NEX DE VS Energy Dispersive X-ray Fluorescence Spectrometer can analyze from sodium (Na) through uranium (U) non-destructively.
The NEX DE VS Energy Dispersive X-ray Fluorescence Spectrometer uses a FAST SDD® detector for superior data.
The NEX DE VS Energy Dispersive X-ray Fluorescence Spectrometer uses the powerful QuantEZ Windows®-based software.