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GOLDSCOPE SD 520 Spectrometer
Fischer Technology Inc
Not all that glitters is gold – much less pure gold! If you want to know exactly how much gold it contains, you can rely on our X-ray fluorescence (XRF) measuring instruments: With the GOLDSCOPE SD® you can quickly check the authenticity of jewelry and analyze the composition of gold and precious metals – non-destructively. The ...
  • Measurement Type: Contaminant detection and analysis, Chemical identification, Other
  • Lowest Level Detection (LLD) Range: 1 - 1 ppm
  • Resolution: 25000 eV
Data Sheet
FISCHERSCOPE X-RAY XUL AND XULM Spectrometer
Fischer Technology Inc
The FISCHERSCOPE® X-RAY XUL® series is truly fundamental equipment for every electroplating shop. These straightforward and affordable energy dispersive X-ray fluorescence XRF analyzers are excellent for monitoring the bath composition, but they’re also indispensable helpers when it comes to quality control: robust and perfectly ...
  • Measurement Type: Contaminant detection and analysis, Chemical identification, Other
  • Lowest Level Detection (LLD) Range: 1 - 1 ppm
  • Resolution: -- eV
Data Sheet
FISCHERSCOPE X-RAY XAN Spectrometer
Fischer Technology Inc
Like the XUL series, the XRF spectrometer FISCHERSCOPE® X-RAY XAN® are ideally suited for analyzing simply shaped samples. However, a great advantage of the XAN series lies in their high-quality semiconductor detectors. And X-ray fluorescence (XRF) allows you not only to measure the thickness of coatings but also to analyze ...
  • Measurement Type: Contaminant detection and analysis, Chemical identification, Other
  • Lowest Level Detection (LLD) Range: 1 - 1 ppm
  • Resolution: -- eV
Data Sheet
Soft X-ray Emission Spectrometer For EPMA And FE-SEM
JEOL USA Inc
JEOL has developed an unprecedented new type of wavelength dispersive spectrometer (WDS) that utilizes a variable space grating, allowing the efficient and parallel collection of very low energy-rays (so called “soft” X-rays). These new Soft X-ray Emission Spectrometers (SXES) boast not only high spectral resolution (0.3eV) which ...
  • Measurement Type: Elemental analysis, Contaminant detection and analysis
  • Lowest Level Detection (LLD) Range: 1 - 10 ppm
  • Resolution: 0.3 eV
Data Sheet
ElementEye JSX-1000S XRF
JEOL USA Inc
An easy-to-use, smart solution for high-sensitivity elemental analysis, this benchtop ED-XRF spectrometer analyzes major to trace components on most sample types - solids, powders, liquids - with little or no sample preparation. The ElementEye easily complements SEM, EPMA, NMR, and mass spectrometry analyses when needed. The ...
  • Measurement Type: Elemental analysis, Contaminant detection and analysis
  • Lowest Level Detection (LLD) Range: 1 - 1 ppm
  • Resolution: -- eV
Data Sheet
Mercury High Performance Digital Pulse Processor With Mapping Features
XIA LLC
The DXP Mercury packages a high speed digital pulse processors in a compact desktop box with built-in power supply. Peaking times range from 0.1 to 160 µs with a maximum output (at the shortest peaking time) of up to 1Mcps into the spectrum. The DXP Mercury has excellent noise performance suitable for high resolution spectroscopy ...
  • Measurement Type: Elemental analysis, Contaminant detection and analysis, Chemical identification
  • Lowest Level Detection (LLD) Range: 1 - 2 ppm
  • Resolution: 150000 eV
Data Sheet
xMap 4-channel PXI Digital Pulse Processor With Mapping Features
XIA LLC
The DXP xMAP packages 4 high speed digital signal processors into a compact 3U PXI/cPCI module. Each processor offers a peaking time range of 0.1 -100 µs, and can ouput up to 1,000,000 cps into the spectrum. The DXP xMAP has excellent noise performance and is well suited for energy dispersive x-ray measurements over the ...
  • Measurement Type: Other
  • Lowest Level Detection (LLD) Range: 1 - 4 ppm
  • Resolution: 150000 eV
Data Sheet
FalconX8 Ultra-high Rate Digital Pulse Processor
XIA LLC
Many of today’s digital pulse processors suffer debilitating pulse pile-up even at low count rates. The FalconX instruments use powerful SITORO® algorithms to accurately process almost all detected radiation events even at high count rates, recovering data discarded by other pulse processors and delivering superior spectral ...
  • Measurement Type: Elemental analysis
  • Lowest Level Detection (LLD) Range: 1 - 4 ppm
  • Resolution: 180 eV
Data Sheet
Axios FAST
ASD Inc Div of Malvern Panalytical Inc
Multi-element chemical composition analysis in seconds Do you need non-destructive analysis of chemical composition in seconds because of time-critical process control or running sample high-throughputs? With up to 28 elements measured simultaneously in concentration ranges from ppm to 100%, the Malvern Panalytical Axios FAST ...
  • Measurement Type: Thin film metrology, Elemental analysis, Contaminant detection and analysis, Chemical identification
  • Lowest Level Detection (LLD) Range: 0.1 - 100 ppm
  • Resolution: 35 eV
Data Sheet
Epsilon Xflow
ASD Inc Div of Malvern Panalytical Inc
On-line liquid analysis with the Epsilon Xflow gives the solution for fast and accurate control of your process parameters. Increased regulations and quality specifications drive the need for a continue process flow. The Epsilon Xflow enables real-time insight to manage your production processes more efficient and reduce operational costs.
  • Measurement Type: Elemental analysis
  • Lowest Level Detection (LLD) Range: 1 - 1000000 ppm
  • Resolution: 135 eV
Data Sheet
2830 ZT Advanced semiconductor thin film metrology solution
ASD Inc Div of Malvern Panalytical Inc
The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface ...
  • Measurement Type: Thin film metrology, Elemental analysis, Contaminant detection and analysis, Chemical identification
  • Lowest Level Detection (LLD) Range: 0.1 - 1000000 ppm
  • Resolution: 35 eV
Data Sheet
Epsilon 4 Fast and accurate at-line elemental analysis
ASD Inc Div of Malvern Panalytical Inc
Built on the experience and success of the proven Epsilon 3 range of XRF spectrometers, the Epsilon 4 is a multi-functional benchtop XRF analyzer for any industry segment needing elemental analysis from fluorine (F) to americium (Am) in areas from R&D through to process control. Combining the latest excitation and detection ...
  • Measurement Type: Thin film metrology, Elemental analysis, Contaminant detection and analysis
  • Lowest Level Detection (LLD) Range: 1 - 1000000 ppm
  • Resolution: 135 eV
Data Sheet
Epsilon 1 Small, powerful and portable XRF analyzer
ASD Inc Div of Malvern Panalytical Inc
Small, powerful and portable XRF analyzerThe Epsilon 1 is a fully integrated energy dispersive XRF analyzer consisting of a spectrometer, built-in computer, touch screen and analysis software. Powered by the latest advances in excitation and detection technology the Epsilon 1 is a star performer in the low-cost benchtop instrument ...
  • Measurement Type: Elemental analysis, Contaminant detection and analysis, Chemical identification
  • Lowest Level Detection (LLD) Range: 1 - 1000000 ppm
  • Resolution: 135 eV
Data Sheet
Zetium XRF
ASD Inc Div of Malvern Panalytical Inc
Scientifically-sound, benefits-driven innovations achieved with SumXcore technology - an integration of WDXRF, EDXRF and XRD - incorporated into the Zetium platform provide ultimate flexibility, performance and versatility and are on track to revolutionize the world of XRF.
  • Measurement Type: Thin film metrology, Elemental analysis, Contaminant detection and analysis
  • Lowest Level Detection (LLD) Range: 0.1 - 100 ppm
  • Resolution: 35 eV
Data Sheet
NEX LS Process energy dispersive XRF (EDXRF) spectrometer
Applied Rigaku Technologies Inc Div of Rigaku Corp
Featuring advanced third generation energy dispersive X-ray fluorescence (EDXRF) technology, the Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications.Energy dispersive X-ray fluorescence (EDXRF)To deliver superior analytical performance and reliability, the ...
  • Measurement Type: Chemical identification
  • Lowest Level Detection (LLD) Range: 00 - 00 ppm
  • Resolution: N/A eV
Data Sheet
NEX XT Total Sulfur Process Analyzer
Applied Rigaku Technologies Inc Div of Rigaku Corp
Rigaku\'s NEX XT is the next generation process gauge for high-level total sulfur measurement (0.02% to 6% S) of crude, bunker fuel, fuel oils, and other highly viscous hydrocarbons, including residuums. On-Line total sulfur gaugeThis versatile, compact and robust X-ray Transmission / Absorption (XRT / XRA) process gauge is ...
  • Measurement Type: Contaminant detection and analysis
  • Lowest Level Detection (LLD) Range: 00 - 00 ppm
  • Resolution: N/A eV
Data Sheet
NEX OL Process Elemental Analyzer
Applied Rigaku Technologies Inc Div of Rigaku Corp
Featuring advanced 3rd generation energy dispersive X-ray fluorescence (EDXRF) technology, the Rigaku NEX OL represents the next evolution of process elemental analysis for liquid stream and fixed position web or coil applications. Designed to span from heavy industrial through to food grade process gauging solutions, the NEX OL is ...
  • Measurement Type: Elemental analysis
  • Lowest Level Detection (LLD) Range: 00 - 00 ppm
  • Resolution: N/A eV
Data Sheet
NEX CG - Energy Dispersive X-ray Fluorescence Spectrometer
Applied Rigaku Technologies Inc Div of Rigaku Corp
Rigaku NEX CG delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — with minimal standards: Analyze ₁₁Na to ₉₂U non-destructivelySolids, liquids, powders and thin filmsPolarized excitation for lower detection limitsNovel treatment of peak overlap reduces ...
  • Measurement Type: Elemental analysis
  • Lowest Level Detection (LLD) Range: 00 - 00 ppm
  • Resolution: N/A eV
Data Sheet
NEX DE VS Energy Dispersive X-ray Fluorescence Spectrometer
Applied Rigaku Technologies Inc Div of Rigaku Corp
As a premium high performance, SMALL SPOT benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the new Rigaku NEX DE VS delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from ...
  • Measurement Type: Elemental analysis
  • Lowest Level Detection (LLD) Range: 00 - 00 ppm
  • Resolution: N/A eV
Data Sheet
NEX DE Energy Dispersive X-ray Fluorescence Spectrometer
Applied Rigaku Technologies Inc Div of Rigaku Corp
As a premium high performance benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the new Rigaku NEX DE delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to ...
  • Measurement Type: Elemental analysis
  • Lowest Level Detection (LLD) Range: 00 - 00 ppm
  • Resolution: N/A eV
Data Sheet