Description
Type IV aberration corrected flat field and imaging gratings are designed to focus a spectrum onto a plane surface, making them ideal for use with linear or 2-D array detectors. These gratings are produced with grooves that are neither equispaced nor parallel, and are computer optimized to form near-perfect images of the entrance slit on the detector plane.
Owing to their large optical numerical aperture and correction from aberrations, these Type IV aberration corrected flat field & imaging
gratings provide much better light collection efficiency and signal to noise ratio than traditional Type I Rowland circle concave gratings.
When an area detector such as a CCD is utilized, it is often possible to focus multiple sources onto the entrance slit and independently evaluate the spectrum from each source. These “Imaging Gratings” are nearly free from astigmatism, and therefore only one fixed optical element is required to construct an imaging spectrograph.
Flat Field and Imaging Grating 533 00 570
Specifications
Dispersion: | 10 nm/mm |
---|---|
Wavelength Range: | 370 – 760 nm |
Spectrum Length: | 37.1 mm |
F/Number: | 3 |
Groove Density: | 950 l/mm |
Applications
- Spectrographs
- Spectroscopy
- Laser Optics
- Imaging
Frequently Asked Questions
How are these gratings produced?
What are Type IV aberration corrected flat field and imaging gratings used for?
What is the dispersion, wavelength range, and spectrum length of the Type IV flat field and imaging grating with reference number 523 00 020?
What advantages do Type IV aberration corrected flat field and imaging gratings offer compared to traditional Type I Rowland circle concave gratings?
What applications are these gratings suitable for?
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