Description
The XGT-9000 is the new X-ray analytical microscope from HORIBA. The versatility of this instrument makes it a perfect tool for industrial applications, to detect failure problems or foreign particles, as well as R&D. The application domains of Energy Dispersive X-ray Fluorescence (EDXRF) range from cosmetics to pharmacy, archaeology, agri-food, metallurgy, electronics etc… Moreover, this technique can provide both qualitative and quantitative bulk composition of solid and liquid samples. In addition, when equipped with a XY table, large elemental mappings can be provided.
XGT-9000 X-ray Analytical Microscope
Specifications
| Measurement Principle: | Energy dispersive X-ray fluorescence |
|---|---|
| X-Ray Beam Diameter: | Custom |
| Chamber SIze (Width): | 450 mm |
| Chamber Size (Depth): | 500 mm |
| Chamber Size (Height): | 80 mm |
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Frequently Asked Questions
What is the XGT-9000?
The XGT-9000 is an X-ray Fluorescence Analytical Microscope, which provides non-destructive elemental analysis of materials.
What information can be obtained from the XGT-9000?
The XGT-9000 provides qualitative and quantitative elemental analysis, mapping, and hyperspectral imaging.
How does the XGT-9000 detect foreign particles?
The XGT-9000 can detect and determine the composition of foreign particles, allowing for tracking the source of contamination.
Can the XGT-9000 measure the thickness of materials?
Yes, the XGT-9000 has the capability to measure the thickness of materials, including thin and narrow patterns in semiconductors.
Can biological samples be measured with the XGT-9000?
Yes, the XGT-9000 has a unique partial vacuum mode that allows for measurement of biological samples in ambient conditions, avoiding damage or modification.
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