Frequently Asked Questions

The XGT-9000 is an X-ray Fluorescence Analytical Microscope, which provides non-destructive elemental analysis of materials.

The XGT-9000 provides qualitative and quantitative elemental analysis, mapping, and hyperspectral imaging.

The XGT-9000 can detect and determine the composition of foreign particles, allowing for tracking the source of contamination.

Yes, the XGT-9000 has the capability to measure the thickness of materials, including thin and narrow patterns in semiconductors.

Yes, the XGT-9000 has a unique partial vacuum mode that allows for measurement of biological samples in ambient conditions, avoiding damage or modification.

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