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Frequently Asked Questions

Yes, the system can make farfield and nearfield measurements to measure the optical output of your laser diode and nearfield measurements of laser bars.

Yes, with the Telops Laser Diode Characterization System, you will receive first-class support to make your testing process easy.

Yes, the system is fully automated and generates test reports automatically.

The Telops Laser Diode Characterization System measures and provides detailed analysis of the performance characteristics of your laser device such as optical power, spectrum, nearfield and farfield.

The system is used for new device qualification, laser diode characterization, laser qualification, and fast data analysis for failures in the field.

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