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Chemical identification X-Ray Fluorescence Spectroscopy

GOLDSCOPE SD 520 Spectrometer
Fischer Technology Inc
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GOLDSCOPE SD 520 Spectrometer
Not all that glitters is gold – much less pure gold! If you want to know exactly how much gold it contains, you can rely on our X-ray fluorescence (XRF) measuring instruments: With the GOLDSCOPE SD® you can quickly check the authenticity of jewelry and analyze the composition of gold and precious metals – non-destructively. The ...

Specifications
Measurement Type: Contaminant detection and analysis, Chemical identification, Other
Lowest Level Detection (LLD) Range: 1-1ppm
Resolution: 25000 eV
Data Sheet
FISCHERSCOPE X-RAY XUL AND XULM Spectrometer
Fischer Technology Inc
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FISCHERSCOPE X-RAY XUL AND XULM Spectrometer
The FISCHERSCOPE® X-RAY XUL® series is truly fundamental equipment for every electroplating shop. These straightforward and affordable energy dispersive X-ray fluorescence XRF analyzers are excellent for monitoring the bath composition, but they’re also indispensable helpers when it comes to quality control: robust and perfectly ...

Specifications
Measurement Type: Contaminant detection and analysis, Chemical identification, Other
Lowest Level Detection (LLD) Range: 1-1ppm
Resolution: -- eV
Data Sheet
FISCHERSCOPE X-RAY XAN Spectrometer
Fischer Technology Inc
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FISCHERSCOPE X-RAY XAN Spectrometer
Like the XUL series, the XRF spectrometer FISCHERSCOPE® X-RAY XAN® are ideally suited for analyzing simply shaped samples. However, a great advantage of the XAN series lies in their high-quality semiconductor detectors. And X-ray fluorescence (XRF) allows you not only to measure the thickness of coatings but also to analyze ...

Specifications
Measurement Type: Contaminant detection and analysis, Chemical identification, Other
Lowest Level Detection (LLD) Range: 1-1ppm
Resolution: -- eV
Data Sheet
Axios FAST
ASD Inc Div of Malvern Panalytical Inc
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Axios FAST
Multi-element chemical composition analysis in seconds Do you need non-destructive analysis of chemical composition in seconds because of time-critical process control or running sample high-throughputs? With up to 28 elements measured simultaneously in concentration ranges from ppm to 100%, the Malvern Panalytical Axios FAST ...

Specifications
Measurement Type: Thin film metrology, Elemental analysis, Contaminant detection and analysis, Chemical identification
Lowest Level Detection (LLD) Range: 0.1-100ppm
Resolution: 35 eV
Data Sheet
2830 ZT Advanced semiconductor thin film metrology solution
ASD Inc Div of Malvern Panalytical Inc
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2830 ZT Advanced semiconductor thin film metrology solution
The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface ...

Specifications
Measurement Type: Thin film metrology, Elemental analysis, Contaminant detection and analysis, Chemical identification
Lowest Level Detection (LLD) Range: 0.1-1000000ppm
Resolution: 35 eV
Data Sheet
Epsilon 1 Small, powerful and portable XRF analyzer
ASD Inc Div of Malvern Panalytical Inc
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Epsilon 1 Small, powerful and portable XRF analyzer
Small, powerful and portable XRF analyzerThe Epsilon 1 is a fully integrated energy dispersive XRF analyzer consisting of a spectrometer, built-in computer, touch screen and analysis software. Powered by the latest advances in excitation and detection technology the Epsilon 1 is a star performer in the low-cost benchtop instrument ...

Specifications
Measurement Type: Elemental analysis, Contaminant detection and analysis, Chemical identification
Lowest Level Detection (LLD) Range: 1-1000000ppm
Resolution: 135 eV
Data Sheet
NEX LS Process energy dispersive XRF (EDXRF) spectrometer
Applied Rigaku Technologies Inc Div of Rigaku Corp
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NEX LS Process energy dispersive XRF (EDXRF) spectrometer
Featuring advanced third generation energy dispersive X-ray fluorescence (EDXRF) technology, the Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications.Energy dispersive X-ray fluorescence (EDXRF)To deliver superior analytical performance and reliability, the ...

Specifications
Measurement Type: Chemical identification
Lowest Level Detection (LLD) Range: 00-00ppm
Resolution: N/A eV
Data Sheet
On FindLight marketplace you will find 7 different Chemical identification X-Ray Fluorescence Spectroscopy from suppliers around the world. With just a few clicks you can compare different Chemical identification X-Ray Fluorescence Spectroscopy and get accurate price quotes based on your needs and quantity required. Note that some wholesale suppliers may offer discounts for large quantities. From any product page you can directly contact any vendor within seconds.