Specifications

Probe Spectral Range: 200 – 1700 nm
Wavelength Range: UV-VIS, VIS-NIR
Spectral Range: 200-1700 nm
S/N Ratio: 600:1, 800:1, 14667:1
Resolution (Pre-configured): ~2/10 nm
Wavelength Accuracy: ±1, ±5 nm
Lamp Life: 2000 hours (typical)
A/D: 16bit
Stability: ±0.5%
Measurement Range: 1%-100%
Interface: USB2.0
Power Supply: 15VDC,3A
Trigger: Software, hardware, synchronous
Operating Temperature: 5°C - 35°C (25°C recommended)
Operating System: Win XP/7/8/10/11
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Features


  • High Accuracy Measurement: Delivers precise readings for absorbance, reflectivity, transmissivity, and fluorescence.

  • Modular Design: Easily adaptable to different sample types, wavelengths, and detectors.

  • Real-Time Data Display: Instant visualization of spectral curves, FWHM, and peak intensities.

  • High Repeatability: Ensures consistent results across multiple measurements.

  • Software Integration: Supports data storage, export, and secondary development with SDK.

  • Wide Wavelength Coverage: Options ranging from UV-VIS to VIS-NIR and IR for comprehensive analysis.

  • Flexible Sampling: Cuvette, immersion probe, optical fiber, and integrating sphere configurations available.

  • LED/Laser Measurement Capability: Measures central wavelength, optical power, FWHM, chromaticity, and efficiency.

  • Compact & Portable Options: Certain models offer compact designs for easy integration and field use.

Applications


  • Chemical & Biochemical Analysis: Absorbance and fluorescence measurements for solution and material concentration.

  • Surface and Color Analysis: Reflectivity kits for determining surface color, diffuse, and specular reflection.

  • Optical Materials Testing: Transmissivity measurement of filters, lenses, and curved optical components.

  • LED & Laser Characterization: Wavelength, power, FWHM, and chromaticity testing for light sources.

  • Scientific Research & Education: Suitable for laboratories, universities, and industrial R&D.

  • Industrial Quality Control: Ensures precise monitoring and characterization of optical components.

  • Secondary Development: SDK-enabled systems for customized integration and automation.