508 PV Microscope Spectrophotometer

Specifications

Spectral Range: 250 – 2100 nm
Spectral Resolution: 3 nm
Detection Spectral Range: 1 – 1 nm
Excitation Laser Wavelength: Other
Sample Stage (manual Or Motorized): X or Y or Z
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Features


  • Add Spectroscopy to Any Microscope: The 508 PV™ easily attaches to any microscope or probe station, enhancing it with spectroscopy, colorimetry, and micro spot film thickness measurement capabilities.

  • Advanced Lightblades™ Technology: Incorporates Lightblades™ spectrophotometers specifically designed for microspectroscopy, ensuring precise and reliable results.

  • Wide Spectral Range: User-selected spectral range from deep UV to near infrared (250 to 2100 nm), allowing for versatile applications.

  • Permanently Calibrated: Offers variable measurement areas, even below a micron, ensuring accuracy and precision in every measurement.

  • Thermoelectric Cooling: Available to improve signal-to-noise ratios and ensure long-term stability of measurements.

  • High-Resolution Imaging: Incorporates high-resolution, color digital imaging with up to 6 megapixels available for detailed analysis.

  • Lambdafire™ Software: Comes with Lambdafire™ spectroscopy and imaging control and analysis software, featuring touchscreen control for ease of use.

  • Versatile Microspectroscopy: Capable of transmission and reflectance microspectroscopy, expanding the range of possible analyses.

  • Upgrade Older Systems: A cost-effective solution to upgrade older microspectrometers with the latest hardware and software advancements.

  • Ideal for Diverse Applications: Perfect for colorimetry of pixels on flat panel displays, reflectometry of vitrinite coal and source rock, and thin film thickness measurements of optics and semiconductors.

Applications


  • Colorimetry of Pixels on Flat Panel Displays: Analyze the color accuracy and consistency of pixels on modern display technologies.

  • Reflectometry of Vitrinite Coal and Source Rock: Measure the reflectance properties of geological samples for research and industrial applications.

  • Thin Film Thickness Measurements: Determine the thickness of thin films in optics and semiconductor industries with precision.

  • Transmission Microspectroscopy: Collect transmission spectra of microscopic samples to study their optical properties.

  • Reflectance Microspectroscopy: Obtain reflectance spectra to analyze surface characteristics of materials.

  • Fluorescence and Luminescence Spectra Collection: Capture fluorescence and luminescence spectra for advanced material analysis.

  • Upgrade Older Microspectrometers: Enhance existing systems with the latest optics, electronics, and software for improved performance.