Staib Instruments Inc

STAIB Instruments: Pioneering High-Performance Surface Analysis Instruments for Over 30 Years. From components to complete systems, we provide excellence, quality, and reliability in surface analysis. Established in 1987 by Dr. Philippe Staib near Munich, Germany, our dedicated team of skilled scientists and technicians innovates instruments tailored for research, development, and manufacturing. We excel in RHEED, AUGER, XPS, EELS, REELS, Electron Sources, Ion Sources, X-ray Sources, and more. Our commitment extends to support, training, and service globally, ensuring customer success. We proudly received the R&D 100 Award for the Real Time Element Monitoring System using an Auger Probe in 2016. STAIB Instruments continually advances surface analysis solutions, marked by milestones such as the 50 nm UHV scanning electron microscope and innovative electron sources. Patented and patent-pending devices reinforce our commitment to excellence. Visit us at upcoming events and connect for tailored solutions. STAIB Instruments – Advancing Surface Analysis Excellence.