Applied Research & Photonics Inc

Applied Research & Photonics, Inc. (ARP) pioneers groundbreaking technology in semiconductor and nano-material research with its revolutionary TeraSpectra system. TeraSpectra, a Terahertz Nano-Scanning Spectrometer, offers non-contact, non-destructive testing with unparalleled spatial resolution. The system's 3D imaging capabilities break current optical inspection limits, precisely identifying defects' location and depth. ARP extends its impact through testing services, aiding researchers and manufacturers in visualizing and identifying surface and sub-layer defects in 3D.

Key features include non-destructive testing, sub-surface layer inspection, sub-nanometer resolution, and fast turnaround. TeraSpectra's innovation transforms semiconductor and nano-material analysis, providing richer information without sample damage. ARP's commitment to advancing technology is evident in its proprietary Dendrimer Dipole Excitation technology, powering the TNS3DI Terahertz Nanoscanning Spectrometer and 3D Imager. This tool offers unsurpassed analytical and imaging capabilities, addressing challenges in various industries, including displays, medical, and atomic-level investigations.