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X-Ray Fluorescence Spectroscopy

GOLDSCOPE SD 520 Spectrometer
Fischer Technology Inc
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GOLDSCOPE SD 520 Spectrometer
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Not all that glitters is gold – much less pure gold! If you want to know exactly how much gold it contains, you can rely on our X-ray fluorescence (XRF) measuring instruments: With the GOLDSCOPE SD® you can quickly check the authenticity of jewelry and analyze the composition of gold and precious metals – non-destructively. The ...

Specifications
Measurement Type: Contaminant detection and analysis, Chemical identification, Other
Lowest Level Detection (LLD) Range: 1-1ppm
Resolution: 25000 eV
Data Sheet
FISCHERSCOPE X-RAY XUL AND XULM Spectrometer
Fischer Technology Inc
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FISCHERSCOPE X-RAY XUL AND XULM Spectrometer
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The FISCHERSCOPE® X-RAY XUL® series is truly fundamental equipment for every electroplating shop. These straightforward and affordable energy dispersive X-ray fluorescence XRF analyzers are excellent for monitoring the bath composition, but they’re also indispensable helpers when it comes to quality control: robust and perfectly ...

Specifications
Measurement Type: Contaminant detection and analysis, Chemical identification, Other
Lowest Level Detection (LLD) Range: 1-1ppm
Resolution: -- eV
Data Sheet
FISCHERSCOPE X-RAY XAN Spectrometer
Fischer Technology Inc
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FISCHERSCOPE X-RAY XAN Spectrometer
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Like the XUL series, the XRF spectrometer FISCHERSCOPE® X-RAY XAN® are ideally suited for analyzing simply shaped samples. However, a great advantage of the XAN series lies in their high-quality semiconductor detectors. And X-ray fluorescence (XRF) allows you not only to measure the thickness of coatings but also to analyze ...

Specifications
Measurement Type: Contaminant detection and analysis, Chemical identification, Other
Lowest Level Detection (LLD) Range: 1-1ppm
Resolution: -- eV
Data Sheet
Soft X-ray Emission Spectrometer For EPMA And FE-SEM
JEOL USA Inc
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Soft X-ray Emission Spectrometer For EPMA And FE-SEM
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JEOL has developed an unprecedented new type of wavelength dispersive spectrometer (WDS) that utilizes a variable space grating, allowing the efficient and parallel collection of very low energy-rays (so called “soft” X-rays). These new Soft X-ray Emission Spectrometers (SXES) boast not only high spectral resolution (0.3eV) which ...

Specifications
Measurement Type: Elemental analysis, Contaminant detection and analysis
Lowest Level Detection (LLD) Range: 1-10ppm
Resolution: 0.3 eV
Data Sheet
ElementEye JSX-1000S XRF
JEOL USA Inc
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ElementEye JSX-1000S XRF
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An easy-to-use, smart solution for high-sensitivity elemental analysis, this benchtop ED-XRF spectrometer analyzes major to trace components on most sample types - solids, powders, liquids - with little or no sample preparation. The ElementEye easily complements SEM, EPMA, NMR, and mass spectrometry analyses when needed. The ...

Specifications
Measurement Type: Elemental analysis, Contaminant detection and analysis
Lowest Level Detection (LLD) Range: 1-1ppm
Resolution: -- eV
Data Sheet
Axios FAST
ASD Inc Div of Malvern Panalytical Inc
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Axios FAST
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Multi-element chemical composition analysis in seconds Do you need non-destructive analysis of chemical composition in seconds because of time-critical process control or running sample high-throughputs? With up to 28 elements measured simultaneously in concentration ranges from ppm to 100%, the Malvern Panalytical Axios FAST ...

Specifications
Measurement Type: Thin film metrology, Elemental analysis, Contaminant detection and analysis, Chemical identification
Lowest Level Detection (LLD) Range: 0.1-100ppm
Resolution: 35 eV
Data Sheet
Epsilon Xflow
ASD Inc Div of Malvern Panalytical Inc
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Epsilon Xflow
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On-line liquid analysis with the Epsilon Xflow gives the solution for fast and accurate control of your process parameters. Increased regulations and quality specifications drive the need for a continue process flow. The Epsilon Xflow enables real-time insight to manage your production processes more efficient and reduce operational costs.

Specifications
Measurement Type: Elemental analysis
Lowest Level Detection (LLD) Range: 1-1000000ppm
Resolution: 135 eV
Data Sheet
2830 ZT Advanced semiconductor thin film metrology solution
ASD Inc Div of Malvern Panalytical Inc
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2830 ZT Advanced semiconductor thin film metrology solution
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The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface ...

Specifications
Measurement Type: Thin film metrology, Elemental analysis, Contaminant detection and analysis, Chemical identification
Lowest Level Detection (LLD) Range: 0.1-1000000ppm
Resolution: 35 eV
Data Sheet
Epsilon 4 Fast and accurate at-line elemental analysis
ASD Inc Div of Malvern Panalytical Inc
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Epsilon 4 Fast and accurate at-line elemental analysis
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Built on the experience and success of the proven Epsilon 3 range of XRF spectrometers, the Epsilon 4 is a multi-functional benchtop XRF analyzer for any industry segment needing elemental analysis from fluorine (F) to americium (Am) in areas from R&D through to process control. Combining the latest excitation and detection ...

Specifications
Measurement Type: Thin film metrology, Elemental analysis, Contaminant detection and analysis
Lowest Level Detection (LLD) Range: 1-1000000ppm
Resolution: 135 eV
Data Sheet
Epsilon 1 Small, powerful and portable XRF analyzer
ASD Inc Div of Malvern Panalytical Inc
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Epsilon 1 Small, powerful and portable XRF analyzer
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Small, powerful and portable XRF analyzerThe Epsilon 1 is a fully integrated energy dispersive XRF analyzer consisting of a spectrometer, built-in computer, touch screen and analysis software. Powered by the latest advances in excitation and detection technology the Epsilon 1 is a star performer in the low-cost benchtop instrument ...

Specifications
Measurement Type: Elemental analysis, Contaminant detection and analysis, Chemical identification
Lowest Level Detection (LLD) Range: 1-1000000ppm
Resolution: 135 eV
Data Sheet
Zetium XRF
ASD Inc Div of Malvern Panalytical Inc
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Zetium XRF
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Scientifically-sound, benefits-driven innovations achieved with SumXcore technology - an integration of WDXRF, EDXRF and XRD - incorporated into the Zetium platform provide ultimate flexibility, performance and versatility and are on track to revolutionize the world of XRF.

Specifications
Measurement Type: Thin film metrology, Elemental analysis, Contaminant detection and analysis
Lowest Level Detection (LLD) Range: 0.1-100ppm
Resolution: 35 eV
Data Sheet
NEX LS Process energy dispersive XRF (EDXRF) spectrometer
Applied Rigaku Technologies Inc Div of Rigaku Corp
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NEX LS Process energy dispersive XRF (EDXRF) spectrometer
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Featuring advanced third generation energy dispersive X-ray fluorescence (EDXRF) technology, the Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications.Energy dispersive X-ray fluorescence (EDXRF)To deliver superior analytical performance and reliability, the ...

Specifications
Measurement Type: Chemical identification
Lowest Level Detection (LLD) Range: 00-00ppm
Resolution: N/A eV
Data Sheet
NEX XT Total Sulfur Process Analyzer
Applied Rigaku Technologies Inc Div of Rigaku Corp
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NEX XT Total Sulfur Process Analyzer
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Rigaku\'s NEX XT is the next generation process gauge for high-level total sulfur measurement (0.02% to 6% S) of crude, bunker fuel, fuel oils, and other highly viscous hydrocarbons, including residuums. On-Line total sulfur gaugeThis versatile, compact and robust X-ray Transmission / Absorption (XRT / XRA) process gauge is ...

Specifications
Measurement Type: Contaminant detection and analysis
Lowest Level Detection (LLD) Range: 00-00ppm
Resolution: N/A eV
Data Sheet
NEX OL Process Elemental Analyzer
Applied Rigaku Technologies Inc Div of Rigaku Corp
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NEX OL Process Elemental Analyzer
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Featuring advanced 3rd generation energy dispersive X-ray fluorescence (EDXRF) technology, the Rigaku NEX OL represents the next evolution of process elemental analysis for liquid stream and fixed position web or coil applications. Designed to span from heavy industrial through to food grade process gauging solutions, the NEX OL is ...

Specifications
Measurement Type: Elemental analysis
Lowest Level Detection (LLD) Range: 00-00ppm
Resolution: N/A eV
Data Sheet
NEX CG - Energy Dispersive X-ray Fluorescence Spectrometer
Applied Rigaku Technologies Inc Div of Rigaku Corp
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NEX CG - Energy Dispersive X-ray Fluorescence Spectrometer
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Rigaku NEX CG delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — with minimal standards: Analyze ₁₁Na to ₉₂U non-destructivelySolids, liquids, powders and thin filmsPolarized excitation for lower detection limitsNovel treatment of peak overlap reduces ...

Specifications
Measurement Type: Elemental analysis
Lowest Level Detection (LLD) Range: 00-00ppm
Resolution: N/A eV
Data Sheet
NEX DE VS Energy Dispersive X-ray Fluorescence Spectrometer
Applied Rigaku Technologies Inc Div of Rigaku Corp
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NEX DE VS Energy Dispersive X-ray Fluorescence Spectrometer
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As a premium high performance, SMALL SPOT benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the new Rigaku NEX DE VS delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from ...

Specifications
Measurement Type: Elemental analysis
Lowest Level Detection (LLD) Range: 00-00ppm
Resolution: N/A eV
Data Sheet
NEX DE Energy Dispersive X-ray Fluorescence Spectrometer
Applied Rigaku Technologies Inc Div of Rigaku Corp
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NEX DE Energy Dispersive X-ray Fluorescence Spectrometer
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As a premium high performance benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the new Rigaku NEX DE delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to ...

Specifications
Measurement Type: Elemental analysis
Lowest Level Detection (LLD) Range: 00-00ppm
Resolution: N/A eV
Data Sheet
NEX QC+ QuantEZ - Energy Dispersive X-ray Fluorescence
Applied Rigaku Technologies Inc Div of Rigaku Corp
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NEX QC+ QuantEZ - Energy Dispersive X-ray Fluorescence
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Windows®-based EDXRF for rapid elemental analysisAs a premium low cost benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the Rigaku NEX QC+ QuantEZ delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in ...

Specifications
Measurement Type: Elemental analysis
Lowest Level Detection (LLD) Range: 00-00ppm
Resolution: N/A eV
Data Sheet
NEX QC - Energy Dispersive X-ray Fluorescence Analyzer
Applied Rigaku Technologies Inc Div of Rigaku Corp
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NEX QC - Energy Dispersive X-ray Fluorescence Analyzer
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Rigaku NEX QC energy dispersive X-ray fluorescence (EDXRF) analyzer delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types: Analyze ₁₁Na to ₉₂U non-destructivelySolids, liquids, alloys, powders and thin films50kV X-ray tube for wide elemental ...

Specifications
Measurement Type: Elemental analysis
Lowest Level Detection (LLD) Range: 00-00ppm
Resolution: N/A eV
Data Sheet
NEX QC MFA - Marine Fuel Sulfur Analyzer
Applied Rigaku Technologies Inc Div of Rigaku Corp
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NEX QC MFA - Marine Fuel Sulfur Analyzer
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Rigaku NEX QC energy dispersive X-ray fluorescence (EDXRF) analyzer delivers rapid quantitative determination of sulfur in a wide variety of marine fuels: Analyze sulfur (S) non-destructively down to low ppm levelsAnalyze nickel (Ni), vanadium (V) and iron (Fe) if neededAnalyze for zinc (Zn) to determine if fuel has been ...

Specifications
Measurement Type: Contaminant detection and analysis
Lowest Level Detection (LLD) Range: 00-00ppm
Resolution: N/A eV
Data Sheet
There are 20 different X-Ray Fluorescence Spectroscopy from suppliers and manufacturers listed in this category. In just a few clicks you can compare different X-Ray Fluorescence Spectroscopy with each other and get an accurate quote based on your needs and specifications. Please note that the prices of X-Ray Fluorescence Spectroscopy vary significantly for different products based on various factors including technical parameters, features, brand name, etc. Please contact suppliers directly to inquire about the details and accurate pricing information for any product model. Simply navigate to the product page of interest and use the orange button to directly reach out to the respective supplier with one click.