OL 750-NVG AUTOMATED SPECTRORADIOMETRIC MEASUREMENT SYSTEM
Description
The OL 750-NVG is a specifically configured version of the OL 750 Spectroradiometer for NVG compatibility measurements. This complete turnkey system exceeds the requirements of MIL-L-85762A and incorporates direct viewing imaging optics. An optional built-in photometer is available, and as with all of our spectroradiometers, all calibration software is provided. Its modular design accommodates expansion to other applications, such as detector spectral response (DSR) and source spectral analysis (SSA) from 200 nm to 30 µm.
OL 750-NVG AUTOMATED SPECTRORADIOMETRIC MEASUREMENT SYSTEM
Specifications |
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| Wavelength Range (reflectance): | 200-30000nm |
| Resolution: | -- nm |
| Minimum Scan Time: | -- sec |
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Frequently Asked Questions
The OL 750-NVG is a specifically configured version of the OL 750 Spectroradiometer for NVG compatibility measurements. It is a complete turnkey system that exceeds the requirements of MIL-L-85762A and incorporates direct viewing imaging optics.
The OL 750-NVG is used for spectroradiometric and photometric certification of night vision devices.
The OL 750-NVG incorporates an extremely sensitive GaAs PMT signal detection system with a research grade single or double grating monochromator. The sensitivity is NEP 10 -16 watts.
Depending on the level of the spectral radiance, the time required to scan over the wavelength range 380 to 930 nm at 5 nm intervals varies from 1 to 5 minutes.
The OL 750-NVG is capable of extremely sensitive spectroradiometric and photometric measurements over the wavelength range of 380 to 930 nm.