Helia Photonics Ltd
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Frequently Asked Questions

The visual inspection of the substrate is performed to examine the incoming material and ensure its quality and suitability for the desired process.

The inspection data can be immediately accessed by customers through secure online access, allowing for instantaneous yield analysis.

The post-processing analysis of spectrophotometric data is conducted to ensure that the required thin film has been deposited accurately during the optical thin film deposition process.

Different types and areas of components, such as laser facets and contact points, can be inspected both before and after the process as desired by the customer.

Helia Photonics utilizes optical analysis hardware and software, along with extensive engineering knowledge and experience, to ensure that the thin film meets the desired specifications.

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