Flat Field and Imaging Grating 523 00 030
Description
Type IV aberration corrected flat field and imaging gratings are designed to focus a spectrum onto a plane surface, making them ideal for use with linear or 2-D array detectors. These gratings are produced with grooves that are neither equispaced nor parallel, and are computer optimized to form near-perfect images of the entrance slit on the detector plane.
Owing to their large optical numerical aperture and correction from aberrations, these Type IV aberration corrected flat field & imaging
gratings provide much better light collection efficiency and signal to noise ratio than traditional Type I Rowland circle concave gratings.
When an area detector such as a CCD is utilized, it is often possible to focus multiple sources onto the entrance slit and independently evaluate the spectrum from each source. These “Imaging Gratings” are nearly free from astigmatism, and therefore only one fixed optical element is required to construct an imaging spectrograph.
Flat Field and Imaging Grating 523 00 030
Specifications |
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|---|---|
| Dispersion: | 24 nm/mm |
| Wavelength Range: | 200-800nm |
| Spectrum Length: | 25 mm |
| F/Number: | 3.2 |
| Groove Density: | 200 l/mm |
Applications
- Spectrographs
- Spectroscopy
- Laser Optics
- Imaging
For pricing, technical or any other questions please contact the supplier
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How to order?
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Ships from:
United States
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Sold by:
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On FindLight:
since 2016
Frequently Asked Questions
They offer complete customer service, including expert technical advice for optimizing system configurations to meet customers’ needs. They are ISO9001:2000 certified, and their well-staffed departments are committed to customer satisfaction and product quality.
They provide much better light collection efficiency and signal to noise ratio than traditional Type I Rowland circle concave gratings due to their large optical numerical aperture and correction from aberrations.
They are produced with grooves that are neither equispaced nor parallel and are computer optimized to form near-perfect images of the entrance slit on the detector plane.
They are nearly free from astigmatism, and therefore only one fixed optical element is required to construct an imaging spectrograph.
They are designed to focus a spectrum onto a plane surface, making them ideal for use with linear or 2-D array detectors.