Frequently Asked Questions

The X-fiz Fizeau Interferometer is suitable for measurement of surface irregularity, surface flatness, transmitted wavefront error, and reflected wavefront error.

The X-fiz Fizeau Interferometer features a high resolution 1.3 MP camera, remote controlled and positioned motorized zoom with 10X optical magnification, motorized focus adjustment, smart electronic attenuator with automatic saturation adjustment, highly rigid frame and robust opto-mechanical design, and a high quality piezo phase shifter with tip-tilt TS holder.

The X-fiz Fizeau Interferometer uses an industry standard 632.8nm HeNe laser.

The smart Maintenance Concept of the X-fiz Fizeau Interferometer allows for change of laser and electrical components within minutes without opening the sensitive optical area of the system. A laser change does not require a realignment and the process can be done with the interferometer still installed within the measurement platform.

The X-fiz Fizeau Interferometer is a phase shifting interferometer available in 4", 5.2", and 6" versions.

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