QED Inteferometer for Stitching QIS
Description
The QIS interferometer completely designed, engineered and built by QED Technologies. It is optimized for stitching and gives customers the ability to measure more parts, with improved accuracy, speed and ease of use. QED’s QIS incorporates hardware and software features designed to enhance the performance of QED’s metrology products. The proprietary QIS coherent imaging system allows the user to obtain measurements with higher fringe densities and greater contrast. The advanced optical design of QIS reduces common errors, such as retrace and magnification errors. In addition, the greater focus travel provided by QIS allows for the measurement of parts with shorter radii than possible with a general purpose interferometer. QIS was also designed using the same software platform, QED.NET, as QED’s Q-flex™ MRF™ systems, which enables seamless communications between systems. The new 1920 x 1920 pixel, high-resolution camera allows for improved spot measurement capability. This means that you can more accurately characterize the MRF removal function, enabling you to make better manufacturing process decisions and achieve convergence faster and with more accuracy.
QED Inteferometer for Stitching QIS
Specifications |
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|---|---|
| Interferometer Configuration: | Not Specified |
| Light Source: | Not Specified |
| Output Polarization: | Not Specified |
| RMS Repeatability: | Not Specified |
| RMS Precision: | Not Specified |
Features
Higher lateral resolution: greater slope capture, resolve smaller features
Better spot metrology for MRF
Auto focusing and larger focus range
Convenience
Reduced opportunity for operator error
Enhanced aspheric capability and reduced measurement cycle time
Improved interferometer calibration and reduced low-order uncertainty
Integrated software platform
Applications
QIS gives you more aspheric capability
Fewer subapertures (for already-testable aspheres)
Automatic focusing
Reliable asphere acquisitions
Improved sopt metrology
Use your existing Zygo interferometer on a bench
For pricing, technical or any other questions please contact the supplier
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Frequently Asked Questions
QIS is available on the ASI(Q) platform, or as a field upgrade to existing ASI and SSI-A platforms.
QIS has higher lateral resolution, better spot metrology for MRF, auto focusing and larger focus range, convenience, reduced opportunity for operator error, enhanced aspheric capability, and reduced measurement cycle time.
The proprietary QIS coherent imaging system allows the user to obtain measurements with higher fringe densities and greater contrast.
The QED Inteferometer for Stitching QIS is a metrology instrument designed for measuring extreme aspheric departures with improved accuracy, speed, and ease of use.
QIS was designed using the same software platform, QED.NET, as QED’s Q-flex™ MRF™ systems, which enables seamless communications between systems.