Halcyonics GmbH
Are you Halcyonics GmbH representative? Claim This Page Today!
No one from Halcyonics GmbH has updated the information yet
Claim Halcyonics GmbH Page to edit and add data


Frequently Asked Questions

The nanofilm_RSE is a special type of ellipsometer that compares the sample to a reference, allowing for measurement of the ellipsometric difference between the two.

The nanofilm_RSE allows for full high resolution spectrum measurement in a single-shot, with a data rate of 100 spectra per second. It also enables the acquisition of large field film thickness maps within a few minutes.

The nanofilm_RSE is suitable for applications such as wafer inspection, thickness measurement of ultrathin films and interlayers, detection of contaminants, and measurement of thin layers on transparent substrates.

Yes, the nanofilm_RSE includes spectroscopic information between 450 and 900 nm, which is important when multiple parameters of the processed layer are variable, such as thickness and optical density.

Yes, the nanofilm_RSE allows for easy and fast live fitting of layer thickness during measurement.

You May Also Like