Imaging Ellipsometer Nanofilm-ep4
Description
The new generation of microscopic thin film, surface and materials metrology tool uses a combination of auto nulling ellipsometry and microscopy to enable surface characterization with lateral resolution as small as 1 micron. This enables resolving sample areas 1000 times smaller than most non-imaging ellipsometers, even if they use micro spot spectroscopic option.
The nanofilm_ep4 uses a variety of unique features that allow the visualization of your surface in real time. You will see the structure of your sample on a microscopic scale and measure parameters like thickness, refractive index and absorption. 3D profile maps of selected areas can be recorded. Instrument combinations with other technologies like AFM, QCM-D, reflectometry, Raman spectroscopy, etc. are possible to receive even more information from your samples.
Imaging Ellipsometer Nanofilm-ep4
Specifications |
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|---|---|
| Spectral Range: | 250-1700nm |
| Spectral Resolution: | 300 nm |
| Angle Of Incidence: | 1-1deg |
Features
- Direct sample visualization with an ellipsometric contrast image with a lateral resolution as small as 1 micron
- Imaging ellipsometry in the wavelength range from 250 nm to 1700 nm
- High range of accessories to cope with a variety of applications (SPR or solid/liquid cells, light guide for liquid/liquid interfaces, microfluidic, temperature control, electrochemistry cells and many more)
- Real time ellipsometric contrast images provide a fast view of the surface, any defects or structures
- Parallel measurement of multiple areas within the selected field of view
- Knife edge illumination avoids background reflection and allows measurements on thin transparent substrates
For pricing, technical or any other questions please contact the supplier
- No registration required
- No markups, no fees
- Direct contact with supplier
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How to order?
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Ships from:
Germany
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Sold by:
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On FindLight:
External Vendor
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Frequently Asked Questions
The lateral resolution of the Nanofilm-ep4 is as small as 1 micron.
The Nanofilm-ep4 can measure parameters like thickness, refractive index, and absorption.
Yes, 3D profile maps of selected areas can be recorded with the Nanofilm-ep4.
Yes, the Nanofilm-ep4 can be combined with other technologies like AFM, QCM-D, reflectometry, Raman spectroscopy, etc.
The Nanofilm-ep4 can perform imaging ellipsometry in the wavelength range from 250 nm to 1700 nm.