Brewster Angle Microscope Nanofim-ep4-bam
Description
The nanofilm_ep4bam is a special configuration of the ep4 imaging ellipsometry platform. It is an ideal thin films imaging system and can be upgraded to an imaging ellipsometer. It is a completely "hands-off" computer-controlled system, using proprietary motor control circuitry. The nanofilm_ep4bam displays real-time images of your sample directly on the monitor and features important image processing functions. An "objective scanner" provides extended depth-of-field for overall-focused images. The combination of a high power green laser and excellent objectives allows lateral resolutions of 1 micron, the current limit of CCD optical detectors. The powerful software makes operation easy and convenient. As a complete solution, the system comes including the computer, electronics, and all necessary software needed to begin measurements on your existing trough, or with one of our integrated troughs. The trough comes as a separate item and is not included as standard.
Brewster Angle Microscope Nanofim-ep4-bam
Specifications |
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| Spectral Range: | 250-1700nm |
| Spectral Resolution: | 1000 nm |
| Angle Of Incidence: | 1-1deg |
Features
- Domains and order phenomena
- Transformation of monolayer into multilayered structures
- Photochemical reaction (e.g. photoisomerization)
- LB-films on solid structures
- Influences of various sub-phase compositions (counter-ions) on monolayer structures
- Polymers and other materials that cannot be detected by fluorescence microscopy
- Adsorption kinetics
- In-situ polymerization in monolayer
- Phase separation
- Quality and homogeneity of LB-films
For pricing, technical or any other questions please contact the supplier
- No registration required
- No markups, no fees
- Direct contact with supplier
Contact Supplier
How to order?
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Ships from:
Germany
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Sold by:
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On FindLight:
External Vendor
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Frequently Asked Questions
The nanofilm_ep4bam is a special configuration of the ep4 imaging ellipsometry platform that is ideal for thin films imaging.
The nanofilm_ep4bam features real-time imaging of samples, extended depth-of-field for focused images, high lateral resolutions of 1 micron, and powerful software for easy operation.
Yes, the nanofilm_ep4bam can measure parameters like thickness, refractive index, and absorption of samples.
Yes, the nanofilm_ep4bam can be combined with other technologies like AFM, QCM-D, reflectometry, and Raman spectroscopy to gather more information from samples.
The nanofilm_ep4bam has the highest lateral resolution available on the market, allowing the resolution of objects as small as 1 micron.