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Page 2 - Optical Inspection Equipment

YXLON FF35 CT HIGH-RESOLUTION CT INSPECTION SYSTEM Panel 4343 CT
Comet North America Inc
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YXLON FF35 CT HIGH-RESOLUTION CT INSPECTION SYSTEM Panel 4343 CT
The YXLON FF35 CT computed tomography system is designed to achieve extremely precise inspection results for a wide range of applications. Available in a single or dual tube configuration, it is perfect for very small to medium-sized parts inspection in the automotive, electronics, aviation, and material science industries.

Specifications
Sample Size (x-axis): 432 mm
Sample Size (y-axis): 432 mm
Pixel Pitch: 139-139um^2
Bit Depth: -- bits
Data Sheet
YXLON Cheetah EVO CUSTOMIZED STANDARD FOR X-RAY INSPECTION
Comet North America Inc
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YXLON Cheetah EVO CUSTOMIZED STANDARD FOR X-RAY INSPECTION
Future smart factories are all about connectivity and self-optimizing processes. Therefore, the most valuable quality control systems are the ones that offer improved automated inspections and can become an integral part of the production line. The new Cheetah EVO system is smartly designed to meet the demands of Industry 4.0, ...

Specifications
Sample Size (x-axis): 800 mm
Sample Size (y-axis): 500 mm
Pixel Pitch: 127-127um^2
Bit Depth: 16 bits
Data Sheet
YXLON UX20 UNIVERSAL X-RAY AND CT INSPECTION SYSTEM Y.Panel 2323 HB
Comet North America Inc
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YXLON UX20 UNIVERSAL X-RAY AND CT INSPECTION SYSTEM Y.Panel 2323 HB
We designed the UX20 system from the ground up for fast and easy x-ray inspection of your parts. The award-winning user interface Geminy enables an easy inspection, both for your 2D and 3D inspection needs. Our efficient workflows with automation, wizards and presets guide the user.  Different user roles help to streamline your ...

Specifications
Sample Size (x-axis): 710 mm
Sample Size (y-axis): 1090 mm
Pixel Pitch: 179-179um^2
Bit Depth: 16 bits
Data Sheet
Model 262-TR Reflectometer - Transmissometer
Dyn-Optics
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Model 262-TR Reflectometer - Transmissometer
The Model 262-TR Transmissometer / Reflectometer is a precision instrument designed to accurately measure the transmissivity and reflectivity of a wide range of samples. The system consists of a sample measurement stage fiber optically coupled to a signal processing and display console. The sample stage is built on a rigid rail ...
Data Sheet
Model 262 Reflectometer
Dyn-Optics
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Model 262 Reflectometer
The Model 262 Reflectometer was developed for the Bright Plating industry to measure reflectance at various locations on a spun aluminum curved surface for streetlight and other reflectors. This compact desktop instrument is easy to use and simple to calibrate thereby providing production people with a rapid means to assure ...
Data Sheet
LIGHTSpEED Unpatterned Surface Inspection Solution
FOGALE Nanotech
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LIGHTSpEED Unpatterned Surface Inspection Solution
The LIGHTSpEED is the first unpatterned surface inspection solution that combines darkfield inspection and advanced Synchronous Doppler Detection Technology to capture nanometer scale defects on all kind of wafers. As a part of the modular LIGHTsEE series from UnitySC the LIGHTSpEED can be used as a stand-alone tool or as part of a ...
Data Sheet
TMAP-AP Metrology Solution For 3D IC-TSV Process Control
FOGALE Nanotech
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TMAP-AP Metrology Solution For 3D IC-TSV Process Control
The TMAP-AP  is the complete metrology solution for 3D IC/TSV process control with the best balance between performance, throughput and cost of ownership (CoO). The TMAP-AP measure multiple layer stacks and differentiate them in the order they are placed. Even under highly warped conditions, the TMAP Series’ state of ...
Data Sheet
TMAP NST3D Non-Contact Full Field Metrology Solution
FOGALE Nanotech
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TMAP NST3D Non-Contact Full Field Metrology Solution
The TMAP NST is a non contact full field metrology solution based on optical microscopy enabling surface topography measurements at the nano scale. The TMAP NST  is pushing the boundaries of conventional microscopy with performances that stretch beyond contact profilometry and into the AFM space.
Data Sheet
Gocator 1350 High-Speed 3D Laser Point Profile Sensor
FocalSpec Inc
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Gocator 1350 High-Speed 3D Laser Point Profile Sensor
Use Gocator laser point profile sensors for high-speed dimensional measurements (e.g. surface roughness, object thickness) in closed-loop automation systems.

Specifications
Gauge Type: Laser Triangulation
Standoff Distance: 200 mm
Measurement Depth Of Field: 200 mm
Measurement Range (X): - mm
Measurement Range (Y): - mm
Data Sheet
Gocator 1340 High-Speed 3D Laser Point Profile Sensor
FocalSpec Inc
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Gocator 1340 High-Speed 3D Laser Point Profile Sensor
Use Gocator laser point profile sensors for high-speed dimensional measurements (e.g. surface roughness, object thickness) in closed-loop automation systems.

Specifications
Gauge Type: Laser Triangulation
Standoff Distance: 162.5 mm
Measurement Depth Of Field: 95 mm
Measurement Range (X): - mm
Measurement Range (Y): - mm
Data Sheet
Temperature Fiber Optic Sensor THR-NS-1165B
Fiso Technologies Inc
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Temperature Fiber Optic Sensor THR-NS-1165B
FISO is a pioneer in the introducon of fiber opc sensing technologies in medical applicaons. We have also built a strong reputaon in laboratories and medical research centers with the versality of the soluons it can offer. In addion, the automaon level reached in the assembly processes allowed FISO to reach the status of world leader ...

Specifications
Operation Temperature Range: 10-90deg C
Temperature Sensitivity: -- pm/degC
Response Time: 0.025 Sec
Probe Diameter: 10 mm
Probe Length: -- mm
Data Sheet
Temperature Fiber Optic Sensor THR-NS-1165C
Fiso Technologies Inc
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Temperature Fiber Optic Sensor THR-NS-1165C
FISO is a pioneer in the introducon of fiber opc sensing technologies in medical applicaons. We have also built a strong reputaon in laboratories and medical research centers with the versality of the soluons it can offer. In addion, the automaon level reached in the assembly processes allowed FISO to reach the status of world leader ...

Specifications
Operation Temperature Range: 10-90deg C
Temperature Sensitivity: -- pm/degC
Response Time: 0.025 Sec
Probe Diameter: 10 mm
Probe Length: -- mm
Data Sheet
SPC-HR Reading Module
Fiso Technologies Inc
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SPC-HR Reading Module
The SPC-HR, like all FISO FPI Modules, is compable with evolu- on chassis and with the evoluon on evoluon evoluon soIware1 . The SPC-HR is suitable for medical temperature measurements. It can be used with the same chassis as other FISO FPI Modules and used at the same me on an EVO plaJorm. The light source life expectancy is above ...

Specifications
Operation Temperature Range: 10-50deg C
Temperature Sensitivity: -- pm/degC
Response Time: 0.016 Sec
Probe Diameter: -- mm
Probe Length: -- mm
Data Sheet
Sorting And Metrology Equipment
GigaMat Technologies Inc
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Sorting And Metrology Equipment
Bare wafer geometry metrology systems for wafer manufacturers.
Data Sheet
PV-SI BIREFRINGENCE MEASUREMENT SYSTEM
Hinds Instruments Inc
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PV-SI BIREFRINGENCE MEASUREMENT SYSTEM
During the production of Si solar panels, stress in Si crystals often remains undetected long into the fabrication process. Hinds Instruments has developed a stress birefringence instrument for measuring Si ingots, either squared or as-grown, before they are sawed into wafers. When this instrument is used as a QC tool, low quality Si ...

Specifications
Retardation Range: 0.1-775nm
Max Measurement Rate: 100 PPS
Light Source Wavelength: -- nm
Measurement Area Length: 500 mm
Measurement Area Width: 150 mm
Data Sheet
Exicor OIA Premier Birefringence Measurement System
Hinds Instruments Inc
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Exicor OIA Premier Birefringence Measurement System
The Hinds™ Instruments Exicor® OIA is the Premier Birefringence Measurement System for the evaluation of Lenses, Parallel Faced Optics and Curved Optics at normal and oblique incident angles. The system is built on Hinds Instruments award winning Photoelastic Modulator (PEM) based Exicor Birefringence Measurement ...

Specifications
Retardation Range: 0-300nm
Max Measurement Rate: -- PPS
Light Source Wavelength: 632.8 nm
Measurement Area Length: 320 mm
Measurement Area Width: 320 mm
Data Sheet
GEN SERIES BIREFRINGENCE MEASUREMENT SYSTEM
Hinds Instruments Inc
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GEN SERIES BIREFRINGENCE MEASUREMENT SYSTEM
The Exicor® GEN5 and GEN6 systems are large format sample measurement units built on the core Exicor low level birefringence measurement technology and precision automated motion control elements.  These platforms provide unsurpassed low level birefringence measurements to support the precision characterization of display ...

Specifications
Retardation Range: 0.005-300nm
Max Measurement Rate: 100 PPS
Light Source Wavelength: 632.8 nm
Measurement Area Length: 1 mm
Measurement Area Width: 1 mm
Data Sheet
Simplimax Automated Package Inspection
I4 Solutions LLC
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Simplimax Automated Package Inspection
How many things can go wrong when packaging your product? From vendor errors to setup issues, too much is at stake to leave it to chance. With Simplimax automated package inspection, you can:Confirm that your products are in the correct packages, have the right labels and marks, and have been properly filled and sealedReduce scrap by ...

Specifications
Resolution Range: 1-1dpi
Inspection Type: Print, Code, Images, Logos, Symbols, Other
Data Sheet
Candela 8520 High Sensitivity High Throughput Wafer Inspection Tool
KLA
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Candela 8520 High Sensitivity High Throughput Wafer Inspection Tool
The Candela® 8520 2nd generation integrated surface and photoluminescence inspection system is designed for advanced characterization of substrate and epitaxial defects for the power device market and related applications. Implementation of automated wafer inspection with statistical process control (SPC) methodology can ...
Data Sheet
Candela 8720 High Sensitivity Wafer Inspectiont Tool
KLA
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Candela 8720 High Sensitivity Wafer Inspectiont Tool
The Candela® 8720 advanced surface inspection system captures a variety of mission-critical substrate and epitaxial defects for the LED, photonics, communications and other compound semiconductor markets. Implementation of automated wafer inspection with statistical process control (SPC) methodology can significantly cut yield ...
Data Sheet
Candela 8420 Optical Surface Analyzer
KLA
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Candela 8420 Optical Surface Analyzer
The Candela® 8420 system serves the photonics, LED, commu- nications and other compound semiconductor markets. Candela 8420 uses classic Candela technology of multi-channel detection and rule-based defect binning to perform advanced inspection for determination of yield impacting defects on blanket wafers across multiple material ...
Data Sheet
Ultra-Low Temperature Rox RX-102B-RS
Janis Research Co LLC
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Ultra-Low Temperature Rox RX-102B-RS
With the amazing progress made by dilution refrigerator manufacturers to push base temperatures well below 10 mK, the need for accurate, simplified temperature measurements continues to grow. The RX-102B-RS meets this need as a resistive temperature device (RTD) that maintains sensitivity well below 10 mK. Building on ...

Specifications
Operation Temperature Range: 0.1-10deg C
Temperature Sensitivity: 100 pm/degC
Response Time: -- Sec
Probe Diameter: -- mm
Probe Length: -- mm
Data Sheet
Interchangable Rox RX-102A Temperature Sensor
Janis Research Co LLC
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Interchangable Rox RX-102A Temperature Sensor
Ruthenium oxide temperature sensors are thick-film resistors, with most models suitable for use in applications involving magnetic fields. These composite sensors consist of bismuth ruthenate, ruthenium oxides, binders, and other compounds that allow them to obtain the necessary temperature and resistance characteristics. Each Lake ...

Specifications
Operation Temperature Range: 0.05-40deg C
Temperature Sensitivity: -- pm/degC
Response Time: -- Sec
Probe Diameter: -- mm
Probe Length: -- mm
Data Sheet
Cernox CX-1010 Thin Film Resistance Cryogenic Temperature Sensor
Janis Research Co LLC
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Cernox CX-1010 Thin Film Resistance Cryogenic Temperature Sensor
Cernox® thin film resistance temperature sensors offer significant advantages over comparable bulk or thick film resistance sensors. The smaller package size of these thin film sensors makes them useful in a broader range of experimental mounting schemes, and they are also available in a chip form. They are easily mounted in ...

Specifications
Operation Temperature Range: 0.1-420deg C
Temperature Sensitivity: 1000000000 pm/degC
Response Time: -- Sec
Probe Diameter: -- mm
Probe Length: -- mm
Data Sheet
TubeProfiler
LIMAB
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TubeProfiler
The LIMAB TubeProfiler system measures the outer diameter, ovality and true shape of tubes and billets. The system can be installed in cold or hot rolling applications. The TubeProfiler integrates up to 24 sensors for an accurate measurement of the true cross section of the produced product. The TubeProfiler system has proven its ...

Specifications
Working Distance: -- mm
Lateral Sampling: -- um
Reproducibility (3 Sigma): -- um
Data Sheet