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Frequently Asked Questions

The alpha300 RA incorporates all the features of the alpha300 R (Raman) and the alpha300 A (AFM) instruments provided in one microscope. It offers an excellent combination of comprehensive surface characterization on the nanometer scale (AFM) with chemical imaging (Raman). It is strictly correlative, and moving the sample between the measurements is not necessary. It allows convenient switching between the measurement techniques by rotation of the objective turret.

Correlative Raman AFM imaging is a technique that facilitates a comprehensive understanding of the samples by combining two complementary imaging techniques, Raman microscopy, and Atomic Force Microscopy (AFM), in a single instrument without compromise.

TERS stands for Tip-Enhanced Raman Spectroscopy, which is a high-resolution Raman AFM measurement technique.

The alpha300 RA allows simultaneous Raman-AFM measurements, which means that the two complementary imaging techniques are available in a single instrument without compromise. It also allows the effortless correlation of the Raman and AFM results and the image overlay.

The alpha300 RA is an integrated Raman AFM system that combines the features of the Raman microscopy system alpha300 R for powerful chemical imaging along with Atomic Force Microscopy (alpha300 A) for high-resolution nanoscale surface characterization.

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