Range From Focus
Description
Sunrise Optical LLC (http://zebraoptical.com) has developed an optical is immune
to mechanical vibrations and stray light. tool for precise topography measurement of rough or feature rich samples. precision piezo stage. The defocused images are then analyzed using a proprietary algorithm to recover the topography and roughness of the sample. The unit is sold as an attachment to the standard ZebraOptical Microscope system. Technology is similar to that presented in the Small Splatter metrology tool in our standard brochure.
Range From Focus
Features
Flatness
Curvature
Roughness Parameters
Ra (arithmetic average)
RMS (root mean squared)
Rv (maximum valley depth)
Rp (maximum peak height)
Rt (maximum profile height)
Rsk (skew)
Rku (kurtosis)
For pricing, technical or any other questions please contact the supplier
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- No markups, no fees
- Direct contact with supplier
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Frequently Asked Questions
The Range from Focus tool is limited to samples which have feature-rich surfaces, for which the system can measure and analyze defocused measurement of smooth surfaces.
The roughness parameters that can be calculated using the Range from Focus tool are Ra (arithmetic average), RMS (root mean squared), Rv (maximum valley depth), Rp (maximum peak height), Rt (maximum profile height), Rsk (skew), and Rku (kurtosis).
The principle of operation of the Range from Focus tool involves a precision stage that varies the z-position of the sample to produce both focused and blurred images. The coordinate from defocus tool can be used to calculate various surface parameters.
The Range from Focus tool is an optical tool developed by Sunrise Optical LLC for precise topography measurement of rough or feature-rich samples.
The technology used in the Range from Focus tool is similar to that presented in the Small Splatter metrology tool in their standard brochure.